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ISO 18115-1

Surface chemical analysis - Vocabulary - Part 1: General terms and terms used in spectroscopy

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Organization: ISO
Publication Date: 15 November 2013
Status: active
Page Count: 112
ICS Code (Chemical analysis): 71.040.40
ICS Code (Chemical technology (Vocabularies)): 01.040.71
scope:

This part of ISO 18115 defines terms for surface chemical analysis. It covers general terms and those used in spectroscopy while ISO 18115-2 covers terms used in scanning-probe microscopy.

Document History

18115-1
June 1, 2023
Surface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopy
This part of the ISO 18115 series defines terms for surface chemical analysis. It covers general terms and those used in spectroscopy, while ISO 18115-2 covers terms used in scanning-probe microscopy...
ISO 18115-1
November 15, 2013
Surface chemical analysis - Vocabulary - Part 1: General terms and terms used in spectroscopy
This part of ISO 18115 defines terms for surface chemical analysis. It covers general terms and those used in spectroscopy while ISO 18115-2 covers terms used in scanning-probe microscopy.
ISO 18115-1
July 15, 2010
Surface chemical analysis - Vocabulary - Part 1: General terms and terms used in spectroscopy
ISO 18115 defines terms for surface chemical analysis. This part covers general terms and those used in spectroscopy while Part 2 covers terms used in scanning-probe microscopy.

References

This document references:
ISO 80000-10 - Quantities and units — Part 10: Atomic and nuclear physics
Published by ISO on August 1, 2019
This document gives names, symbols, definitions and units for quantities used in atomic and nuclear physics. Where appropriate, conversion factors are also given.
This document references:
ISO/IEC GUIDE 99 - International vocabulary of metrology - Basic and general concepts and associated terms (VIM)
Published by ISO on January 1, 2007
In this Vocabulary, a set of definitions and associated terms is given, in English and French, for a system of basic and general concepts used in metrology, together with concept diagrams to...
This document references:
ISO GUIDE 30 - Reference materials — Selected terms and definitions AMENDMENT 1: Revisions of definitions for reference material and certified reference material
Published by ISO on September 4, 2019
A description is not available for this item.
This document is referenced by:
ISO 16129 - Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
Published by ISO on November 1, 2018
This document is designed to allow the user to assess, on a regular basis, several key parameters of an X‑ray photoelectron spectrometer. It is not intended to provide an exhaustive performance...
This document is referenced by:
ASTM E2735 - Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments
Published by ASTM on February 1, 2014
This guide describes an approach to enable users and analysts to determine the calibrations and standards useful to obtain meaningful surface chemistry data with X-ray photoelectron spectroscopy...
This document is referenced by:
ISO 14707 - Surface chemical analysis — Glow discharge optical emission spectrometry (GD-OES) — Introduction to use
Published by ISO on March 1, 2021
This document provides guidelines that are applicable to bulk and depth profiling GD-OES analyses. The guidelines discussed herein are limited to the analysis of rigid solids, and do not cover the...
This document is referenced by:
ASTM E1078 - Standard Guide for Specimen Preparation and Mounting in Surface Analysis
Published by ASTM on October 1, 2014
This guide covers specimen preparation and mounting prior to, during, and following surface analysis and applies to the following surface analysis disciplines: Auger electron spectroscopy (AES),...
This document is referenced by:
ASTM E1829 - Standard Guide for Handling Specimens Prior to Surface Analysis
Published by ASTM on October 1, 2014
This guide covers specimen handling and preparation prior to surface analysis and applies to the following surface analysis disciplines: Auger electron spectroscopy (AES), X-ray photoelectron...
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