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ISO 18115-1

Surface chemical analysis - Vocabulary - Part 1: General terms and terms used in spectroscopy

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Organization: ISO
Publication Date: 15 July 2010
Status: inactive
Page Count: 110
ICS Code (Chemical analysis): 71.040.40
ICS Code (Chemical technology (Vocabularies)): 01.040.71
scope:

ISO 18115 defines terms for surface chemical analysis. This part covers general terms and those used in spectroscopy while Part 2 covers terms used in scanning-probe microscopy.

Document History

18115-1
June 1, 2023
Surface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopy
This part of the ISO 18115 series defines terms for surface chemical analysis. It covers general terms and those used in spectroscopy, while ISO 18115-2 covers terms used in scanning-probe microscopy...
ISO 18115-1
November 15, 2013
Surface chemical analysis - Vocabulary - Part 1: General terms and terms used in spectroscopy
This part of ISO 18115 defines terms for surface chemical analysis. It covers general terms and those used in spectroscopy while ISO 18115-2 covers terms used in scanning-probe microscopy.
ISO 18115-1
July 15, 2010
Surface chemical analysis - Vocabulary - Part 1: General terms and terms used in spectroscopy
ISO 18115 defines terms for surface chemical analysis. This part covers general terms and those used in spectroscopy while Part 2 covers terms used in scanning-probe microscopy.

References

This document references:
ISO 80000-10 - Quantities and units — Part 10: Atomic and nuclear physics
Published by ISO on August 1, 2019
This document gives names, symbols, definitions and units for quantities used in atomic and nuclear physics. Where appropriate, conversion factors are also given.
This document references:
ISO GUIDE 30 - Reference materials — Selected terms and definitions AMENDMENT 1: Revisions of definitions for reference material and certified reference material
Published by ISO on September 4, 2019
A description is not available for this item.
This document references:
ISO/IEC GUIDE 99 - International vocabulary of metrology - Basic and general concepts and associated terms (VIM)
Published by ISO on January 1, 2007
In this Vocabulary, a set of definitions and associated terms is given, in English and French, for a system of basic and general concepts used in metrology, together with concept diagrams to...
This document is referenced by:
ASTM E1217 - Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
Published by ASTM on November 1, 2011
This practice describes methods for determining the specimen area contributing to the detected signal in Auger electron spectrometers and some types of X-ray photoelectron spectrometers (spectrometer...
This document is referenced by:
ISO TS 10797 - Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy
Published by ISO on June 1, 2012
This Technical Specification establishes methods for characterizing the morphology of single-wall carbon nanotubes (SWCNTs) and identifying the elemental composition of other materials in SWCNT...
This document is referenced by:
ISO 15632 - Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
Published by ISO on February 1, 2021
This document defines the most important quantities that characterize an energy-dispersive X‑ray spectrometer consisting of a semiconductor detector, a pre-amplifier and a signal-processing unit as...
This document is referenced by:
ISO 11505 - Surface chemical analysis - General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
Published by ISO on December 15, 2012
This International describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer...
This document is referenced by:
ISO 13424 - Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of results of thin-film analysis
Published by ISO on October 1, 2013
This International Standard specifies the minimum amount of information required in reports of analyses of thin films on a substrate by XPS. These analyses involve measurement of the chemical...
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