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JEDEC JESD 8-22

HSUL_12 LPDDR2 and LPDDR3 I/O with Optional ODT

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Organization: JEDEC
Publication Date: 1 April 2014
Status: active
Page Count: 38
scope:

This standard defines the input, output specifications and ac test conditions for devices that are designed to operate in the High Speed Unterminated Logic (HSUL_12) logic switching range, nominally 0 V to 1.2 V. The standard may be applied to ICs operating with separate VDD and VDDQ supply voltages.

Document History

JEDEC JESD 8-22
April 1, 2014
HSUL_12 LPDDR2 and LPDDR3 I/O with Optional ODT
This standard defines the input, output specifications and ac test conditions for devices that are designed to operate in the High Speed Unterminated Logic (HSUL_12) logic switching range, nominally...
October 1, 2012
HSUL_12 LPDDR2 and LPDDR3 I/O with Optional ODT
This standard defines the input, output specifications and ac test conditions for devices that are designed to operate in the High Speed Unterminated Logic (HSUL_12) logic switching range, nominally...
August 1, 2009
HSUL_12 LPDDR2 I/O
This standard defines the input, output specifications and ac test conditions for devices that are designed to operate in the High Speed Unterminated Logic (HSUL_12) logic switching range, nominally...

References

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