scope:

This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B. Q, and M) and space application (device classes S and V) and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available, a choice of radiation hardness assurance (RHA) levels are reflected in the PIN.

The PIN shall be as shown in the following example:

Device classes M, B, and S RHA marked devices shall meet the MIL-M-38510 specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-I-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

The device type(s) shall identify the circuit function as follows:

Device type Generic number 1/ Circuit function Access time 01 8-macrocell EPLD 15 ns 02 8-macrocell EPLD 12 ns

The device class designator shall be a single letter identifying the product assurance level as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 B or S Certification and qualification to MIL-M-38510 Q or V Certification and qualification to MIL-I-38535

The case outline(s) shall be as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style L GDIP3-T24 or CDIP4-T24 24 Dual-in-line 2/

The lead finish shall be as specified In MIL-M-38510 for classes M, B, and S or MIL-I-38535 for classes Q and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.

Supply voltage range to ground potential (V_CC) - - - - - −2.0 V dc to +7.0 V dc DC input voltage range - - - - - - - - - - - - - - - - - −0.5 V dc to V_CC +0.5 V dc Maximum power dissipation - - - - - - - - - - - - - - - 1.5 W 4/ Lead temperature (soldering, 10 seconds) - - - - - - - - +275°C Thermal resistance, Junction-to-case (θ_JC) - - - - - - - See MIL-STD-1835 Junction temperature (T_J)- - - - - - - - - - - - - - - - +150°C Storage temperature range - - - - - - - - - - - - - - - −65°C to +150°C Temperature under bias range - - - - - - - - - - - - - - −55°C to +125°C Endurance - - - - - - - - - - - - - - - - - - - - - - - 25 erase/write cycles (minimum) Data retention - - - - - - - - - - - - - - - - - - - - - 10 years (minimum)

Supply voltage range (V_CC) - - - - - - - - - - - - +4.5 V dc minimum to +5.5 V dc maximum Ground voltage (GND) - - - - - - - - - - - - - - - 0 V dc Input high voltage (V_IH) - - - - - - - - - - - - - 2.0 V dc minimum Input low voltage (V_IL) - - - - - - - - - - - - - 0.8 V dc maximum Case operating temperature range (T_C) - - - - - - −55°C to +125°C Input rise time (t_R) - - - - - - - - - - - - - - - 500 ps maximum Input fall time (t_R) - - - - - - - - - - - - - - - 500 ps maximum

Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) - - - - - - 5/ percent

intended Use: