UNLIMITED FREE
ACCESS
TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

DLA - SMD-5962-92322

MICROCIRCUIT, MEMORY, DIGITAL, CMOS 64K X 8-BIT FAST COLUMN ACCESS UVEPROM, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 17 June 1993
Status: inactive
Page Count: 19
scope:

This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and space application (device classes S and V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

The PIN shall be as shown in the following example:

Device classes M, B, and S RHA marked devices shall meet the MIL-M-38510 specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V devices shall meet or exceed the electrical performance characteristics specified in table I herein after exposure to the specified irradiation levels specified in the absolute maximum ratings herein and the RHA marked device shall be marked in accordance with MIL-I-38535. A dash (-) indicates a non-RHA device.

The device type(s) shall identify the circuit function as follows:

Device type Generic number 1/ Circuit function Access time 01 7C285 64K × 8-bit Fast Column Access UVEPROM 85 ns 02 7C285 64K × 8-bit Fast Column Access UVEPROM 75 ns

The device class designator shall be a single letter identifying the product assurance level as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 B or S Certification and qualification to MIL-M-38510 Q or V Certification and qualification to MIL-I-38535

The case outline(s) shall be as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style 2/ X GDIP4-T28 or CDIP3-T28 28 dual-in-line Y CQCC1-N32 32 rectangular leadless chip carrier Z GDFP2-F28 28 flat pack

The lead finish shall be as specified in MIL-M-38510 for classes M, B, and S or MIL-I-38535 for classes Q and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.

VCC supply voltage range with respect to ground . . . . −0.5 V dc to +7.0 V dc Voltage applied to outputs in high Z state . . . . . . −0.5 V dc to +7.0 V dc Input voltage range with respect to ground . . . . . . −3.0 V dc to +7.0 V dc Maximum power dissipation (PD). . . . . . . . . . . . . 1.1 W 4/ Lead temperature (soldering, 10 seconds) . . . . . . . +260°C Thermal resistance, junction-to-case (θJC) . . . . . . See MIL-STD-1835 Junction temperature (TJ) . . . . . . . . . . . . . . . +175°C 5/ Storage temperature range . . . . . . . . . . . . . . . −65°C to +150°C Temperature under bias . . . . . . . . . . . . . . . . −55°C to +125°C Endurance . . . . . . . . . . . . . . . . . . . . . . . 25 cycles/byte, minimum Data retention . . . . . . . . . . . . . . . . . . . . 10 years, minimum

Supply voltage (VCC). . . . . . . . . . . . . . . . . . +4.5 V dc to +5.5 V dc Ground voltage (GND). . . . . . . . . . . . . . . . . . 0 V dc Input high voltage (VIH). . . . . . . . . . . . . . . . 2.0 V dc minimum Input low voltage (VIL) . . . . . . . . . . . . . . . . 0.8 V dc maximum Case operating temperature range (TC) . . . . . . . . . −55°C to 125°C

Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012). . . . . . . . XX percent 6/

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Microcircuits... View More

Document History

January 19, 2023
MICROCIRCUIT, MEMORY, DIGITAL, CMOS 64K X 8-BIT FAST COLUMN ACCESS UVEPROM, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. Replaceability....
November 7, 2012
MICROCIRCUIT, MEMORY, DIGITAL, CMOS 64K X 8-BIT FAST COLUMN ACCESS UVEPROM, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD-5962-92322
June 17, 1993
MICROCIRCUIT, MEMORY, DIGITAL, CMOS 64K X 8-BIT FAST COLUMN ACCESS UVEPROM, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and...

References

Advertisement