DLA - SMD-5962-95844
MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 3.3-VOLT NONINVERTING OCTAL BUFFER/DRIVER WITH BUS HOLD, THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
| Organization: | DLA |
| Publication Date: | 18 December 1995 |
| Status: | inactive |
| Page Count: | 19 |
scope:
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and space application (device class V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.
The PIN shall be as shown in the following example:
Device class M RHA marked devices shall meet the MIL-I-38535 appendix A specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-I-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
The device type(s) shall identify the circuit function as follows:
Device type Generic number Circuit function 01 54LVT244 3.3-V noninverting octal buffer/driver with three-state outputs, TTL compatible inputs
The device class designator shall be a single letter identifying the product assurance level as follows:
Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 Q or V Certification and qualification to MIL-I-38535
The case outline(s) shall be as designated in MIL-STD-1835 and as follows:
Outline Letter Descriptive designator Terminals Package style R GDIP1-T20 or CDIP2-T20 20 Dual-in-line S GDFP2-F20 or CDFP3-F20 20 Flat pack 2 CQCC1-N20 20 Square chip carrier package
The lead finish shall be as specified in MIL-STD-883 (see 3.1 herein) for class M or MIL-I-38535 for classes Q and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.
Supply voltage range (VCC) . . . . . . . . . . . . . . . . . . . . . . −0.5 V dc to +4.6 V dc DC input voltage range (VIN) . . . . . . . . . . . . . . . . . . . . . −0.5 V dc to +7.0 V dc 4/ DC output voltage range (VOUT) . . . . . . . . . . . . . . . . . . . . −0.5 V dc to +7.0 V dc 4/ DC input clamp current (IIK) (VIN < 0.0 V) . . . . . . . . . . . . . . −50 mA DC output clamp current (IOK) (VOUT < 0.0 V) . . . . . . . . . . . . . −50 mA DC output current (IOL) (per output) . . . . . . +96 mA DC output current (IOH) (per output) . . . . . . . . . . . . . . . . . +48 mA 5/ Storage temperature range (TSTG) . . . . . . . . . . . . . . . . . . . −65°C to +150°C Maximum power dissipation (PD) . . . . . . . . . . . . . . . . . . . . 500 mW Lead temperature (soldering, 10 seconds) . . . . . . . . . . . . . . . +300°C Thermal resistance, junction-to-case (ΘJC) . . . . . . . . . . . . . . See MIL-STD-1835 Junction temperature (TJ) . . . . . . . . . . . . . . . . . . . . . . +75°C
Supply voltage range (VCC) . . . . . . . . . . . . . . . . . . . . . . +2.7 V dc to +3.6 V dc Input voltage range (VIN) . . . . . . . . . . . . . . . . . . . . . . 0.0 V dc to +5.5 V dc Maximum low level input voltage (VIL) . . . . . . . . . . . . . . . . + 0.8 V Minimum high level input voltage (VIH) . . . . . . . . . . . . . . . . +2.0 V Case operating temperature range (TC) . . . . . . . . . . . . . . . . −55°C to +125°C Maximum input rise and fall rate (outputs enabled)(Δt/ΔV) . . . . . . 10 ns/V Maximum high level output current (IOH) . . . . . . . . . . . . . . . −24 mA Maximum low level output current (IOL) . . . . . . . . . . . . . . . +48 mA
Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) . . . . . . . . . . . . XX percent 7/
Unless otherwise specified, the following specification, standards, bulletin, and handbook of the issue listed in that issue of the Department of Defense Index of Specifications and Standards specified in the solicitation, form a part of this drawing to the extent specified herein.
SPECIFICATION MILITARY MIL-I-38535 - Integrated Circuits, Manufacturing, General Specification for. STANDARDS MILITARY MIL-STD-883 - Test Methods and Procedures for Microelectronics. MIL-STD-973 - Configuration Management. MIL-STD-1835 - Microcircuit Case Outlines. BULLETIN MILITARY MIL-BUL-103 - List of Standardized Military Drawings (SMD's). HANDBOOK MILITARY MIL-HDBK-780 - Standardized Military Drawings.
(Copies of the specification, standards, bulletin, and handbook required by manufacturers in connection with specific acquisition functions should be obtained from the contracting activity or as directed by the contracting activity.)
In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing shall take precedence.
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Microcircuits... View More
Document History