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DLA - DSCC-VID-V62/03610

MICROCIRCUIT, DIGITAL, CMOS, DIGITAL SIGNAL PROCESSOR, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 18 December 2002
Status: inactive
Page Count: 51

Document History

DSCC-VID-V62/03610 REV C
January 16, 2018
MICROCIRCUIT, DIGITAL, CMOS, DIGITAL SIGNAL PROCESSOR, MONOLITHIC SILICON
This drawing documents the general requirements of a high performance digital signal processor microcircuit, with an operating temperature range of -40°C to +100°C for device type 01 and -55°C to...
DSCC-VID-V62/03610 REV B
March 22, 2012
MICROCIRCUIT, DIGITAL, CMOS, DIGITAL SIGNAL PROCESSOR, MONOLITHIC SILICON
This drawing documents the general requirements of a high performance digital signal processor microcircuit, with an operating temperature range of −40°C to +100°C for device type 01 and −55°C to...
DSCC-VID-V62/03610 REV A
November 1, 2005
MICROCIRCUIT, DIGITAL, CMOS, DIGITAL SIGNAL PROCESSOR, MONOLITHIC SILICON
This drawing documents the general requirements of a high performance digital signal processor microcircuit, with an operating temperature range of −40°C to +100°C for device type 01 and −55°C to...
DSCC-VID-V62/03610
December 18, 2002
MICROCIRCUIT, DIGITAL, CMOS, DIGITAL SIGNAL PROCESSOR, MONOLITHIC SILICON
A description is not available for this item.

References

This document references:
IEEE 1149.1 - Test Access Port and Boundary-Scan Architecture
Published by IEEE on February 6, 2013
This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to: - Testing the interconnections between integrated circuits once they have been...
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