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DLA - DSCC-VID-V62/04603 REV A

MICROCIRCUIT, DIGITAL, CMOS, FLOATING-POINT DIGITAL SIGNAL PROCESSOR, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 22 October 2004
Status: inactive
Page Count: 59

Document History

DSCC-VID-V62/04603 REV F
June 18, 2020
MICROCIRCUIT, DIGITAL, CMOS, FLOATING-POINT DIGITAL SIGNAL PROCESSOR, MONOLITHIC SILICON
Scope. This drawing documents the general requirements of a high performance Floating-Point Digital Signal Processor microcircuit, with an operating temperature range of -40°C to +115°C for device...
DSCC-VID-V62/04603 REV E
January 27, 2015
MICROCIRCUIT, DIGITAL, CMOS, FLOATING-POINT DIGITAL SIGNAL PROCESSOR, MONOLITHIC SILICON
This drawing documents the general requirements of a high performance Floating-Point Digital Signal Processor microcircuit, with an operating temperature range of -40°C to +115°C for device type 01,...
DSCC-VID-V62/04603 REV D
August 4, 2008
MICROCIRCUIT, DIGITAL, CMOS, FLOATING-POINT DIGITAL SIGNAL PROCESSOR, MONOLITHIC SILICON
This drawing documents the general requirements of a high performance Floating-Point Digital Signal Processor microcircuit, with an operating temperature range of -40°C to +115°C for device type 01,...
DSCC-VID-V62/04603 REV C
August 17, 2007
MICROCIRCUIT, DIGITAL, CMOS, FLOATING-POINT DIGITAL SIGNAL PROCESSOR, MONOLITHIC SILICON
This drawing documents the general requirements of a high performance Floating-Point Digital Signal Processor microcircuit, with an operating temperature range of -40°C to +115°C for device type 01,...
DSCC-VID-V62/04603 REV B
November 8, 2005
MICROCIRCUIT, DIGITAL, CMOS, FLOATING-POINT DIGITAL SIGNAL PROCESSOR, MONOLITHIC SILICON
This drawing documents the general requirements of a high performance Floating-Point Digital Signal Processor microcircuit, with an operating temperature range of −40°C to +115°C for device type 01,...
DSCC-VID-V62/04603 REV A
October 22, 2004
MICROCIRCUIT, DIGITAL, CMOS, FLOATING-POINT DIGITAL SIGNAL PROCESSOR, MONOLITHIC SILICON
A description is not available for this item.
DSCC-VID-V62/04603
February 4, 2004
MICROCIRCUIT, DIGITAL, CMOS, FLOATING-POINT DIGITAL SIGNAL PROCESSOR, MONOLITHIC SILICON
A description is not available for this item.
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References

This document references:
IEEE 1149.1 - Test Access Port and Boundary-Scan Architecture
Published by IEEE on February 6, 2013
This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to: - Testing the interconnections between integrated circuits once they have been...
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