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DLA - SMD-5962-95632

MICROCIRCUIT, LINEAR, RADIATION HARDENED, CMOS, QUAD DIFFERENTIAL, LINE DRIVER, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 13 July 1995
Status: inactive
Page Count: 18
scope:

This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and space application (device class V), and a choice of case outlines and lead finishes are available and are reflected in the Part or identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

The PIN shall be as shown in the following example:

Device class M RHA marked devices shall meet the MIL-PRF-38535 appendix A specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-PRF-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

The device type(s) shall identify the circuit function as follows:

Device type Generic number Circuit function 01 26CT31RH Radiation hardened, quad differential line driver

The device class designator shall be a single letter identifying the product assurance level as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 Q or V Certification and qualification to MIL-PRF-38535

The case outline(s) shall be as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style E CDIP2-TI6 16 Dual-in-line X CDFP4-Fl6 16 Flat-pack

The lead finish shall be as specified in MIL-STD-883 (see 3.1 herein) for class M or MIL-PRF-38535 for classes Q and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.

Supply voltage . . . . . . . . . . . . . . . . . . . −0.5 V to +7.0 V Input, output or I/O voltage . . . . . . . . . . . . −0.5 V to VDD+0.5 V Output voltage with power off (0 V) . . . . . . . . . −0.5 V to +7.0 V DC diode Input current (any input) . . . . . . . . . ±20 mA DC drain current (any input) . . . . . . . . . . . . 350 mA DC VDD or ground current . . . . . . . . . . . . . . 400 mA Storage temperature range . . . . . . . . . . . . . . −65°C to +150°C Lead temperature (soldering, 10 seconds) . . . . . . 300°C Thermal resistance, junction-to-case (θJC) . . . . . See MIL-STD-1835 Thermal resistance, junction-to-ambient (θJA) . . . . Dip package . . . . . . . . . . . . . . . .. . . 75° C/W Flatpack package . . . . . . . . . . . . . . . . . 95° C/W Power dissipation at 125°C (PD) . . . . . . . . . . . 0.44 W 2/ For T = −55°C to 125°C . . . . . . . . . . . . . . Dip package . . . . . . . . . . . . . . . . . . .667 W Flatpack package . . . . . . . . . . . . . . . .526 W

Operating temperature range (TA). . . . . . . . . . . . −55°C to 125°C Supply voltage range (VDD). . . . . . . . . . . . . . . +4.5 V to +5.5 V Low input voltage (VIL) . . . . . . . . . . . . . . . . 0 V to 0.8 V, maximum High input voltage (VIH). . . . . . . . . . . . . . . . VDD to VDD/2 V, minimum Input rise and fall time . . . . . . . . . . . . . . . 500 ns, maximum Dynamic current (IDYN) at +25°C . . . . . . . . . . . . 3 mA Power dissipation capacitance (CPD) at +25°C. . . . . . 170 pF Radiation features: 3/ SEP effective LET number of upsets . . . . . . . . . . >100[Mev/mg/cm2] Neutron . . . . . . . . . . . . . . . . . . . . . . . . 1 × 1014 neutrons/cm2 Dose rate upset . . . . . . . . . . . . . . . . . . . . 5 × 108 rads(SI)/sec Dose rate survivability . . . . . . . . . . . . . . . . 5 × 1011 rads(SI)/sec

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Microcircuits... View More

Document History

November 24, 2021
MICROCIRCUIT, LINEAR, RADIATION HARDENED, CMOS, QUAD DIFFERENTIAL, LINE DRIVER, MONOLITHIC SILICON
Scope. This drawing documents three product assurance class levels consisting of high reliability (device class Q), space application (device class V) and for appropriate satellite and similar...
January 8, 2020
MICROCIRCUIT, LINEAR, RADIATION HARDENED, CMOS, QUAD DIFFERENTIAL, LINE DRIVER, MONOLITHIC SILICON
Scope. This drawing documents three product assurance class levels consisting of high reliability (device class Q), space application (device class V) and for appropriate satellite and similar...
April 1, 2014
MICROCIRCUIT, LINEAR, RADIATION HARDENED, CMOS, QUAD DIFFERENTIAL, LINE DRIVER, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device class Q), space application (device class V) and for appropriate satellite and similar applications...
May 22, 2013
MICROCIRCUIT, LINEAR, RADIATION HARDENED, CMOS, QUAD DIFFERENTIAL, LINE DRIVER, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device class Q), space application (device class V) and for appropriate satellite and similar applications...
April 17, 2012
MICROCIRCUIT, LINEAR, RADIATION HARDENED, CMOS, QUAD DIFFERENTIAL, LINE DRIVER, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
March 20, 2008
MICROCIRCUIT, LINEAR, RADIATION HARDENED, CMOS, QUAD DIFFERENTIAL, LINE DRIVER, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
March 2, 2007
MICROCIRCUIT, LINEAR, RADIATION HARDENED, CMOS, QUAD DIFFERENTIAL, LINE DRIVER, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
November 27, 2002
MICROCIRCUIT, LINEAR, RADIATION HARDENED, CMOS, QUAD DIFFERENTIAL, LINE DRIVER, MONOLITHIC SILICON
A description is not available for this item.
December 23, 1998
MICROCIRCUIT, LINEAR, RADIATION HARDENED, CMOS, QUAD DIFFERENTIAL, LINE DRIVER, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
November 7, 1996
MICROCIRCUIT, LINEAR, RADIATION HARDENED, CMOS, QUAD DIFFERENTIAL, LINE DRIVER, MONOLITHIC SILICON
This appendix establishes minimum requirements for microcircuit die to be supplied under the Qualified Manufacturers List (QML) Program. QML microcircuit die meeting the requirements of MIL-PRF-38535...
SMD-5962-95632
July 13, 1995
MICROCIRCUIT, LINEAR, RADIATION HARDENED, CMOS, QUAD DIFFERENTIAL, LINE DRIVER, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...

References

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