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NPFC - MIL-M-38510/211

MICROCIRCUITS, DIGITAL, 32,768 BIT SCHOTTKY, BIPOLAR, PROGRAMMABLE READ-ONLY MEMORY (PROM), MONOLITHIC SILICON

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Organization: NPFC
Publication Date: 24 July 1995
Status: inactive
Page Count: 1

Document History

MIL-M-38510/211 VALID NOTICE 3
March 3, 2022
Microcircuits, Digital, 32,768 Bit Schottky, Bipolar, Programmable Read-Only Memory (PROM), Monolithic Silicon
A description is not available for this item.
MIL-M-38510/211
April 13, 2012
MICROCIRCUITS, DIGITAL, 32,768 BIT SCHOTTKY, BIPOLAR, PROGRAMMABLE READ-ONLY MEMORY (PROM), MONOLITHIC SILICON
This specification covers the detail requirements for monolithic silicon, PROM microcircuits which employ thin film nichrome resistors (NiCr), titanium-tungsten (TiW), or zapped vertical emitter as...
MIL-M-38510/211
April 24, 2001
MICROCIRCUITS, DIGITAL, 32,768 BIT SCHOTTKY, BIPOLAR, PROGRAMMABLE READ-ONLY MEMORY (PROM), MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/211
July 24, 1995
MICROCIRCUITS, DIGITAL, 32,768 BIT SCHOTTKY, BIPOLAR, PROGRAMMABLE READ-ONLY MEMORY (PROM), MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/211
April 1, 1987
MICROCIRCUITS, DIGITAL, 32,768 BIT SCHOTTKY, BIPOLAR, PROGRAMMABLE READ-ONLY MEMORY (PROM), MONOLITHIC SILICON
This specification covers the detail requirements for monolithic silicon PROM microcircuits which employ thin film nichrome resistors (NiCr), titanium-tungsten (TiW), or zapped vertical emitter as...

References

This document references:
QML-38510 - CUSTOM HYBRID MICROCIRCUITS GENERAL REQUIREMENTS FOR
Published by NPFC on September 21, 1989
This list has been prepared for use by or for the Government in the acquisition of products covered by Specification MIL-M-38510, Appendix G. Listing of a product is not intended to and does not...
This document references:
MIL-M-38510 - MICROCIRCUITS, GENERAL SPECIFICATION FOR
Published by NPFC on August 27, 1993
A description is not available for this item.
This document references:
MIL-STD-1276 - LEADS FOR ELECTRONIC COMPONENT PARTS
Published by NPFC on February 12, 2018
This standard establishes the method of identifying, specifying, and limiting to a minimum the combinations of basic materials, the thickness and composition of the plating used therewith, and the...
This document references:
MIL-STD-129R CHANGE 3 - MILITARY MARKING FOR SHIPMENT AND STORAGE
Published by ARMY on February 25, 2023
Purpose. This standard provides the minimum requirements for uniform military marking for shipment and storage. Additional marking may be required by the contract or the cognizant activity....
This document references:
MIL-STD-1331 CANC NOTICE 2 - PARAMETERS TO BE CONTROLLED FOR THE SPECIFICATION OF MICROCIRCUITS
Published by DLA on October 30, 1995
A description is not available for this item.
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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