DLA - SMD-5962-99514 REV B
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 1-MEG X 1-BIT SERIAL CONFIGURATION PROM, MONOLITHIC SILICON
inactive
| Organization: | DLA |
| Publication Date: | 13 January 2006 |
| Status: | inactive |
| Page Count: | 16 |
scope:
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device classes M and Q), and nontraditional performance environment (device class N). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. For device class N, the user is cautioned to assure that the device is appropriate for the application environment.
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Document History
January 23, 2023
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 1-MEG X 1-BIT SERIAL CONFIGURATION PROM, MONOLITHIC SILICON
Scope.
This drawing documents three product assurance class levels consisting of high reliability (device classes N and Q) and space application (device class V). A choice of case outlines and lead...
November 27, 2012
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 1-MEG X 1-BIT SERIAL CONFIGURATION PROM, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device class Q), and nontraditional performance environment (device...
SMD-5962-99514 REV B
January 13, 2006
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 1-MEG X 1-BIT SERIAL CONFIGURATION PROM, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device classes M and Q), and nontraditional performance environment...
September 4, 2001
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 1-MEG X 1-BIT SERIAL CONFIGURATION PROM, MONOLITHIC SILICON
A description is not available for this item.
July 14, 1999
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 1-MEG X 1-BIT SERIAL CONFIGURATION PROM, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device classes M and Q), and nontraditional performance environment...