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JEDEC JESD 22-A103

High Temperature Storage Life

inactive
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Organization: JEDEC
Publication Date: 1 November 2004
Status: inactive
Page Count: 10
scope:

The test is applicable for evaluation, screening, monitoring, and/or qualification of all solid state devices. High Temperature storage test is typically used to determine the effect of time and temperature, understorage conditions, for thermally activated failure mechanisms of solid state electronic devices, includingnonvolatile memory devices (data retention failure mechanisms). During the test elevated temperatures(accelerated test conditions) are used without electrical stress applied. This test may be destructive,depending on Time, Temperature and Packaging (if any).

Document History

July 1, 2021
High Temperature Storage Life
The test is applicable for evaluation, screening, monitoring, and/or qualification of all solid state devices. The high temperature storage test is typically used to determine the effects of time...
October 1, 2015
High Temperature Storage Life
The test is applicable for evaluation, screening, monitoring, and/or qualification of all solid state devices. The high temperature storage test is typically used to determine the effects of time...
December 1, 2010
High Temperature Storage Life
The test is applicable for evaluation, screening, monitoring, and/or qualification of all solid state devices. The high temperature storage test is typically used to determine the effects of time...
JEDEC JESD 22-A103
November 1, 2004
High Temperature Storage Life
The test is applicable for evaluation, screening, monitoring, and/or qualification of all solid state devices. High Temperature storage test is typically used to determine the effect of time and...
August 1, 2001
High Temperature Storage Life
A description is not available for this item.
July 1, 1989
Test Method A103-A High Temperature Storage Life (Revision of Test Method A103 Previously Published in JESD22-B)
A description is not available for this item.
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