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JEDEC JESD 22-A103

Test Method A103-A High Temperature Storage Life (Revision of Test Method A103 Previously Published in JESD22-B)

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Organization: JEDEC
Publication Date: 1 July 1989
Status: inactive
Page Count: 4

Document History

July 1, 2021
High Temperature Storage Life
The test is applicable for evaluation, screening, monitoring, and/or qualification of all solid state devices. The high temperature storage test is typically used to determine the effects of time...
October 1, 2015
High Temperature Storage Life
The test is applicable for evaluation, screening, monitoring, and/or qualification of all solid state devices. The high temperature storage test is typically used to determine the effects of time...
December 1, 2010
High Temperature Storage Life
The test is applicable for evaluation, screening, monitoring, and/or qualification of all solid state devices. The high temperature storage test is typically used to determine the effects of time...
November 1, 2004
High Temperature Storage Life
The test is applicable for evaluation, screening, monitoring, and/or qualification of all solid state devices. High Temperature storage test is typically used to determine the effect of time and...
August 1, 2001
High Temperature Storage Life
A description is not available for this item.
JEDEC JESD 22-A103
July 1, 1989
Test Method A103-A High Temperature Storage Life (Revision of Test Method A103 Previously Published in JESD22-B)
A description is not available for this item.
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