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JEDEC JESD 22-A103

High Temperature Storage Life

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Organization: JEDEC
Publication Date: 1 December 2010
Status: inactive
Page Count: 10
scope:

The test is applicable for evaluation, screening, monitoring, and/or qualification of all solid state devices.

The high temperature storage test is typically used to determine the effects of time and temperature, under storage conditions, for thermally activated failure mechanisms and time-to-failure distributions of solid state electronic devices, including nonvolatile memory devices (data retention failure mechanisms). Thermally activated failure mechanisms are modeled using the Arrhenius Equation for acceleration. During the test, accelerated stress temperatures are used without electrical conditions applied. This test may be destructive, depending on time, temperature and packaging (if any).

Document History

July 1, 2021
High Temperature Storage Life
The test is applicable for evaluation, screening, monitoring, and/or qualification of all solid state devices. The high temperature storage test is typically used to determine the effects of time...
October 1, 2015
High Temperature Storage Life
The test is applicable for evaluation, screening, monitoring, and/or qualification of all solid state devices. The high temperature storage test is typically used to determine the effects of time...
JEDEC JESD 22-A103
December 1, 2010
High Temperature Storage Life
The test is applicable for evaluation, screening, monitoring, and/or qualification of all solid state devices. The high temperature storage test is typically used to determine the effects of time...
November 1, 2004
High Temperature Storage Life
The test is applicable for evaluation, screening, monitoring, and/or qualification of all solid state devices. High Temperature storage test is typically used to determine the effect of time and...
August 1, 2001
High Temperature Storage Life
A description is not available for this item.
July 1, 1989
Test Method A103-A High Temperature Storage Life (Revision of Test Method A103 Previously Published in JESD22-B)
A description is not available for this item.

References

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