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BSI - BS EN 61967-1

Integrated Circuits - Measurement of Electromagnetic Emissions, 150 kHZ to 1 GHz - Part 1: General Conditions and Definitions

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Organization: BSI
Publication Date: 2 July 2002
Status: inactive
Page Count: 28
ICS Code (Integrated circuits. Microelectronics): 31.200

Document History

BS EN IEC 61967-1
February 28, 2019
Integrated circuits - Measurement of electromagnetic emissions Part 1: General conditions and definitions
A description is not available for this item.
BS EN 61967-1
July 2, 2002
Integrated Circuits - Measurement of Electromagnetic Emissions, 150 kHZ to 1 GHz - Part 1: General Conditions and Definitions
A description is not available for this item.

References

This document references:
IEC 61000-4-6 - Electromagnetic compatibility (EMC) – Part 4-6: Testing and measurement techniques – Immunity to conducted disturbances, induced by radio-frequency fields
Published by IEC on January 1, 2015
A description is not available for this item.
This document references:
IEC 61967-4 - Integrated circuits – Measurement of electromagnetic emissions – Part 4: Measurement of conducted emissions – 1 Ω/150 Ω direct coupling method
Published by IEC on March 1, 2021
This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe...
This document references:
IEC 60050-161 - Amendment 2 International Electrotechnical Vocabulary Chapter 161: Electromagnetic Compatibility
Published by IEC on April 1, 1998
A description is not available for this item.
This document references:
IEC 61967-2 - Integrated circuits Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 2: Measurement of radiated emissions TEM cell and wideband TEM cell method
Published by IEC on September 1, 2005
This test procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is...
This document references:
IEC 61967-5 - Integrated circuits Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 5: Measurement of conducted emissions Workbench Faraday Cage method
Published by IEC on February 1, 2003
This part of IEC 61967 describes a method to measure the conducted electromagnetic emission of integrated circuits either applied on the standardised test-board or on a final printed circuit board...
This document is referenced by:
BS EN 61967-4 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
Published by BSI on August 19, 2002
A description is not available for this item.
This document is referenced by:
BS EN 61967-2 - Integrated circuits Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 2: Measurement of radiated emissions TEM cell and wideband TEM cell method
Published by BSI on January 23, 2006
A description is not available for this item.
This document is referenced by:
BS EN 61967-8 - Integrated circuits - Measurement of electromagnetic emissions Part 8: Measurement of radiated emissions - IC stripline method
Published by BSI on November 30, 2011
A description is not available for this item.
This document is referenced by:
BS EN 61967-5 - Integrated circuits Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 5: Measurement of conducted emissions Workbench Faraday Cage method
Published by BSI on June 17, 2003
A description is not available for this item.
This document is referenced by:
BS EN 61000-4-7 - Electromagnetic compatibility (EMC) - Part 4-7: Testing and measurement techniques - General guide on harmonics and interharmonics measurements and instrumentation, for power supply systems and equipment connected thereto
Published by BSI on January 29, 2003
A description is not available for this item.
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