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NPFC - MIL-M-38510/751

MICROCIRCUITS, DIGITAL, ADVANCED CMOS, NOR GATES, MONOLITHIC SILICON

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Organization: NPFC
Publication Date: 26 July 2002
Status: inactive
Page Count: 1

Document History

MIL-M-38510/751
September 11, 2019
Microcircuits, Digital, Advanced CMOS, NOR Gates, Monolithic Silicon
A description is not available for this item.
MIL-M-38510/751
November 4, 2014
Microcircuits, Digital, Advanced CMOS, NOR Gates, Monolithic Silicon
A description is not available for this item.
MIL-M-38510/751
January 27, 2010
Microcircuits, Digital, Advanced CMOS, NOR Gates, Monolithic Silicon
This specification covers the detail requirements for monolithic silicon, advanced CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation...
MIL-M-38510/751B
March 18, 2005
MICROCIRCUITS, DIGITAL, ADVANCED CMOS, NOR GATES, MONOLITHIC SILICON
This specification covers the detail requirements for monolithic silicon, advanced CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation...
MIL-M-38510/751
July 26, 2002
MICROCIRCUITS, DIGITAL, ADVANCED CMOS, NOR GATES, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/751
August 9, 1996
MICROCIRCUITS, DIGITAL, ADVANCED CMOS, NOR GATES, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/751
December 29, 1992
MICROCIRCUITS, DIGITAL, ADVANCED CMOS, NOR GATES, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/751
June 29, 1992
MICROCIRCUITS, DIGITAL, ADVANCED CMOS, NOR GATES, MONOLITHIC SILICON
This specification covers the detail requirements for monolithic silicon, advanced, CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and...
MIL-M-38510/751
September 11, 1990
MICROCIRCUITS, DIGITAL, ADVANCED CMOS, NOR GATES, MONOLITHIC SILICON
A description is not available for this item.
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References

This document references:
MIL-STD-1835 - Electronic Component Case Outlines
Published by NPFC on September 21, 2009
This standard establishes and maintains a compilation of electronic component case outlines and should be useful to all levels of manufacturing that culminate in the production of reliable and...
This document references:
JEDEC JESD 78 - IC Latch-Up Test
Published by JEDEC on April 1, 2016
This standard covers the I-test and Vsupply overvoltage latch-up testing of integrated circuits. The purpose of this standard is to establish a method for determining IC latch-up characteristics and...
This document references:
MIL-PRF-38535M - INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR
Published by DLA on November 1, 2022
Scope. This specification establishes the general performance requirements for integrated circuits or microcircuits and the quality and reliability assurance requirements, which are to be met for...
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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