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DLA - SMD-5962-82021 REV D

MICROCIRUITS, MICROPROCESSOR, 16-BIT, N-CHANNEL, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 1 April 1988
Status: inactive
Page Count: 28

Document History

SMD-5962-82021 REV F
October 5, 1992
MICROCIRUITS, MICROPROCESSOR, 16-BIT, N-CHANNEL, MONOLITHIC SILICON
This drawing describes device requirements for class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices"....
SMD-5962-82021 REV E
November 16, 1989
MICROCIRUITS, MICROPROCESSOR, 16-BIT, N-CHANNEL, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-82021 REV D
April 1, 1988
MICROCIRUITS, MICROPROCESSOR, 16-BIT, N-CHANNEL, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-82021 REV C
April 23, 1987
MICROCIRUITS, MICROPROCESSOR, 16-BIT, N-CHANNEL, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-82021 REV B
December 16, 1985
MICROCIRUITS, MICROPROCESSOR, 16-BIT, N-CHANNEL, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-82021 REV A
March 2, 1984
MICROCIRUITS, MICROPROCESSOR, 16-BIT, N-CHANNEL, MONOLITHIC SILICON
A description is not available for this item.
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References

This document references:
MIL-STD-1835 - Electronic Component Case Outlines
Published by NPFC on September 21, 2009
This standard establishes and maintains a compilation of electronic component case outlines and should be useful to all levels of manufacturing that culminate in the production of reliable and...
This document references:
MIL-BUL-103AC CANC NOTICE 1 - LIST OF STANDARD MICROCIRCUIT DRAWINGS
Published by DLA on December 22, 1995
A description is not available for this item.
This document references:
MIL-M-38510 - MICROCIRCUITS, GENERAL SPECIFICATION FOR
Published by NPFC on August 27, 1993
A description is not available for this item.
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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