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DLA - SMD-5962-90864

MICROCIRCUIT, DIGITAL, HCMOS MULTIFUNCTION PERIPHERAL, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 10 April 1992
Status: inactive
Page Count: 37

Document History

SMD-5962-90864 REV A
October 25, 1993
MICROCIRCUIT, DIGITAL, HCMOS MULTIFUNCTION PERIPHERAL, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and...
SMD-5962-90864
April 10, 1992
MICROCIRCUIT, DIGITAL, HCMOS MULTIFUNCTION PERIPHERAL, MONOLITHIC SILICON
A description is not available for this item.

References

This document references:
MIL-STD-1835 - Electronic Component Case Outlines
Published by NPFC on September 21, 2009
This standard establishes and maintains a compilation of electronic component case outlines and should be useful to all levels of manufacturing that culminate in the production of reliable and...
This document references:
MIL-BUL-103AC CANC NOTICE 1 - LIST OF STANDARD MICROCIRCUIT DRAWINGS
Published by DLA on December 22, 1995
A description is not available for this item.
This document references:
MIL-HDBK-780D VALID NOTICE 1 - Standard Microcircuit Drawings
Published by DLA on December 28, 2021
A description is not available for this item.
This document references:
MIL-M-38510 - MICROCIRCUITS, GENERAL SPECIFICATION FOR
Published by NPFC on August 27, 1993
A description is not available for this item.
This document references:
MIL-PRF-38535M - INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR
Published by DLA on November 1, 2022
Scope. This specification establishes the general performance requirements for integrated circuits or microcircuits and the quality and reliability assurance requirements, which are to be met for...
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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