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IEC 60749-12

Semiconductor Devices - Mechanical and Climatic Test Methods - Part 12: Vibration, Variable Frequency

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Organization: IEC
Publication Date: 1 April 2002
Status: inactive
Page Count: 16
ICS Code (Semiconductor devices in general): 31.080.01

Document History

December 1, 2017
Semiconductor devices – Mechanical and climatic test methods – Part 12: Vibration, variable frequency
This part of IEC 60749 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It...
August 1, 2003
SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 12: Vibration, variable frequency CORRIGENDUM 1
A description is not available for this item.
IEC 60749-12
April 1, 2002
Semiconductor Devices - Mechanical and Climatic Test Methods - Part 12: Vibration, Variable Frequency
A description is not available for this item.

References

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