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NPFC - MIL-M-38510/334

MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, AND-OR-INVERT GATES, MONOLITHIC SILICON

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Organization: NPFC
Publication Date: 5 April 1983
Status: inactive
Page Count: 12

Document History

MIL-M-38510/334C VALID NOTICE 4
April 4, 2023
Microcircuits, Digital, Bipolar Advanced Schottky TTL, AND-OR-INVERT Gates, Monolithic Silicon
A description is not available for this item.
MIL-M-38510/334
June 5, 2018
Microcircuits, Digital, Bipolar Advanced Schottky TTL, AND-ORINVERT Gates, Monolithic Silicon
A description is not available for this item.
MIL-M-38510/334
August 23, 2013
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, AND-OR-INVERT GATES, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/334
November 13, 2008
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, AND-OR-INVERT GATES, MONOLITHIC SILICON
This specification covers the detail requirements for monolithic silicon, Advanced Shottky TTL, positive AND-OR-INVERT logic gate microcircuits. Two product assurance classes and a choice of case...
MIL-M-38510/334
December 10, 2003
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, AND-OR-INVERT GATES, MONOLITHIC SILICON
This specification covers the detail requirements for monolithic silicon, Advanced Shottky TTL, positive AND-OR-INVERT logic gate microcircuits. Two product assurance classes and a choice of case...
MIL-M-38510/334
July 8, 2002
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, AND-OR-INVERT GATES, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/334
April 18, 1997
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, AND-OR-INVERT GATES, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/334
September 10, 1987
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, AND-OR-INVERT GATES, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/334
June 23, 1986
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, AND-OR-INVERT GATES, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/334
February 10, 1986
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, AND-OR-INVERT GATES, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/334
May 29, 1985
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, AND-OR-INVERT GATES, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/334
October 25, 1984
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, AND-OR-INVERT GATES, MONOLITHIC SILICON
This specification covers the requirements for monolithic silicon, Advanced Schottky TTL, positive AND-OR-INVERT logic gate microcircuits. Two product assurance classes and a choice of case outlines...
MIL-M-38510/334
April 5, 1983
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, AND-OR-INVERT GATES, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/334 (1)
November 17, 1982
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, AND-OR-INVERT GATES, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/334
May 19, 1981
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, AND-OR-INVERT GATES, MONOLITHIC SILICON
A description is not available for this item.
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References

This document references:
MIL-STD-1835 - Electronic Component Case Outlines
Published by NPFC on September 21, 2009
This standard establishes and maintains a compilation of electronic component case outlines and should be useful to all levels of manufacturing that culminate in the production of reliable and...
This document references:
MIL-PRF-38535M - INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR
Published by DLA on November 1, 2022
Scope. This specification establishes the general performance requirements for integrated circuits or microcircuits and the quality and reliability assurance requirements, which are to be met for...
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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