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DLA - SMD-5962-91566 REV B

MICROCIRCUIT, DIGITAL, CMOS SINGLE CHIP 8-BIT MICROCONTROLLER, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 7 January 1993
Status: inactive
Page Count: 23
scope:

This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and H) and space application (device classes S and V) and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, Provisions for the use of MIL-STD-883 in conjunction with Compliant non-JAN devices". When available, a choice of radiation hardness assurance (RHA) levels are reflected in the PIN.

The PIN shall be as shown in the following example:

Device classes M, B, and S RHA marked devices shall meet the MIL-N-38510 specified RHA levels and shall be marked with the appropriate RHA designator.Device classes Q and V RHA marked devices shall meet the MIL-I-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

The device type(s) shall identify the circuit function as follows:

Device type Generic number Circuit function 01 1/ 87C751 CMOS 8-bit microcontroller with 2 kilobytes EPROM memory 02 87C751 CMOS 8-bit microcontroller with 2 kilobytes one time programmable EPROM memory 03 1/ 87C751-16 CMOS 8-bit microcontroller with 2 kilobytes EPROM memory 04 87C751-16 CMOS 8-bit microcontroller with 2 kilobytes one time programmable EPROM memory

The device class designator shall be a single letter identifying the product assurance level as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 B or S Certification and qualification to MIL-M-38510 Q or V Certification and qualification to MIL-I-38535

For device classes M, B, and S, case outline(s) shall meet the requirements in appendix C of MIL-M-38510 and as listed below. For device classes Q and V, case outline(s) shall meet the requirements of MIL-I-38535, appendix C of MIL-M-38510, and as listed below.

Outline letter Case outline L 1/ D-9 (24-lead, 1.280" × 0.310" × 0.200"), dual-in-line package 3 1/ C-4 (28-lead, 0.460" × 0.460" × 0.100"), square chip carrier package

The Lead finish shall be as specified in MIL-M-38510 for classes M, B, and S or MIL-I-38535 for classes Q and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.

Supply, voltage range (except P0.2/VPP) - - - - - - −0.5 V to +6.5 V Voltage (any pin) to VSS - - - - - - - - - - - - - −0.5 V dc to +6.5 V dc Voltage from (P0.2/VPP) to VSS - - - - - - - - - - −0.5 V to +13 V Storage temperature range - - - - - - - - - - - - - −65°C to +150°C Maximum power dissipation (PD) - - - - - - - - - - 1.0 W Lead temperature (soldering, 10 seconds) - - - - - +300°C Thermal resistance, junction-to-case (ΘJC) - - - - See MIL-M-38510, appendix C Maximum junction temperature (TJ) - - - - - - - - - +175°C Data retention - - - - - - - - - - - - - - - - - - 10 years minimum

Supply voltage range (VCC) - - - - - - - - - - - - 5.0 V dc ±10 percent Case operating temperature range (TC) - - - - - - −55°C to +125°C Maximum low level input voltage: All (except SDA, SCL) - - - - - - - - - - - - - 0.2 VCC − 0.1 V SDA and SCL - - - - - - - - - - - - - - - - - - 0.3 VCC Minimum high level input voltage: All (except SDA, SCL, X1, and RST) - - - - - - - 0.2 VCC + 1.1 V SDA and SCL - - - - - - - - - - - - - - - - - - 0.7 VCC X1 and RST - - - - - - - - - - - - - - - - - - - 0.7 VCC + 0.2 V Oscillator frequency: (devices 01 and 02) - - - - 3.5 MHz to 12 MHz (devices 03 and 04) - - - - 3.5 MHz to 16 MHz

Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) - - - XX percent 2/

Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) - - - 90 percent

intended Use:

Microcircuits conforming to this drawing ape intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Microcircuits... View More

Document History

June 28, 1996
MICROCIRCUIT, DIGITAL, CMOS SINGLE CHIP 8-BIT MICROCONTROLLER, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device classes M and Q), and nontraditional performance environment...
SMD-5962-91566 REV B
January 7, 1993
MICROCIRCUIT, DIGITAL, CMOS SINGLE CHIP 8-BIT MICROCONTROLLER, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and H) and...
October 2, 1992
MICROCIRCUIT, DIGITAL, CMOS SINGLE CHIP 8-BIT MICROCONTROLLER, MONOLITHIC SILICON
A description is not available for this item.
August 29, 1991
MICROCIRCUIT, DIGITAL, CMOS SINGLE CHIP 8-BIT MICROCONTROLLER, MONOLITHIC SILICON
A description is not available for this item.

References

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