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DLA - MIL-M-38510/30

MICROCIRCUITS, DIGITAL, DTL, NAND GATES, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 21 December 1972
Status: inactive
Page Count: 25

Document History

MIL-M-38510/30C VALID NOTICE 2
March 28, 2023
Microcircuits, Digital, DTL, NAND Gates Monolithic Silicon
A description is not available for this item.
MIL-M-38510/30
June 3, 2013
Microcircuits, Digital, DTL, NAND Gates Monolithic Silicon
A description is not available for this item.
MIL-M-38510/30
August 22, 2008
MICROCIRCUITS, DIGITAL, DTL, NAND GATES MONOLITHIC SILICON
This specification covers the detail requirements for monolithic silicon, DTL, positive logic NAND gating microcircuits. Two product assurance classes and a choice of case outlines and lead finishes...
MIL-M-38510/30B
May 3, 2005
MICROCIRCUITS, DIGITAL, DTL, NAND GATES, MONOLITHIC SILICON
This specification covers the detail requirements for monolithic silicon, DTL, positive logic NAND gating microcircuits. Two product assurance classes and a choice of case outlines and lead finishes...
MIL-M-38510/30
June 28, 2002
MICROCIRCUITS, DIGITAL, DTL, NAND GATES, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/30
October 6, 1995
MICROCIRCUITS, DIGITAL, DTL, NAND GATES, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/30
July 19, 1976
MICROCIRCUITS, DIGITAL, DTL, NAND GATES, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/30
December 27, 1974
MICROCIRCUITS, DIGITAL, DTL, NAND GATES, MONOLITHIC SILICON
This specification covers the detail requirements for monolithic silicon, DTL, positive logic NAND gating microcircuits. Three product assurance classes and a choice of case outline/lead finish are...
MIL-M-38510/30
December 21, 1972
MICROCIRCUITS, DIGITAL, DTL, NAND GATES, MONOLITHIC SILICON
A description is not available for this item.
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References

This document references:
MIL-STD-1835 - Electronic Component Case Outlines
Published by NPFC on September 21, 2009
This standard establishes and maintains a compilation of electronic component case outlines and should be useful to all levels of manufacturing that culminate in the production of reliable and...
This document references:
MIL-PRF-38535M - INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR
Published by DLA on November 1, 2022
Scope. This specification establishes the general performance requirements for integrated circuits or microcircuits and the quality and reliability assurance requirements, which are to be met for...
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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