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NPFC - MIL-STD-750

TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES

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Organization: NPFC
Publication Date: 20 November 2006
Status: inactive
Page Count: 685
scope:

Purpose.

This standard establishes uniform methods for testing semiconductor devices, including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions surrounding military operations, and physical and electrical tests. For the purpose of this standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This standard is intended to apply only to semiconductor devices. The test methods described herein have been prepared to serve several purposes:

a. To specify suitable conditions obtainable in the laboratory that give test results equivalent to the actual service conditions existing in the field, and to obtain reproducibility of the results of tests. The tests described herein are not to be interpreted as an exact and conclusive representation of actual service operation in any one geographic location, since it is known that the only true test for operation in a specific location is an actual service test at that point.

b. To describe in one standard all of the test methods of a similar character which now appear in the various joint-services semiconductor device specifications, so that these methods may be kept uniform and thus result in conservation of equipment, man-hours, and testing facilities. In achieving this objective, it is necessary to make each of the general tests adaptable to a broad range of devices.

c. The test methods described herein for environmental, physical, and electrical testing of devices shall also apply, when applicable, to parts not covered by an approved military sheet-form standard, specification sheet, or drawing.

intended Use:

The intended use of this standard is to establish appropriate conditions for testing semiconductor devices to give test results that simulate the actual service conditions existing in the field.... View More

Document History

November 30, 2016
TEST METHODS FOR SEMICONDUCTOR DEVICES
Purpose. This standard establishes uniform methods and procedures for testing semiconductor devices suitable for use within Military and Aerospace electronic systems. The methods and procedures in...
April 29, 2013
TEST METHODS FOR SEMICONDUCTOR DEVICES
Purpose. This standard establishes uniform methods and procedures for testing semiconductor devices suitable for use within Military and Aerospace electronic systems. The methods and procedures in...
January 3, 2012
TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES
Purpose. This standard establishes uniform methods for testing semiconductor devices, including basic environmental tests to determine resistance to deleterious effects of natural elements and...
MIL-STD-750
November 20, 2006
TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES
Purpose. This standard establishes uniform methods for testing semiconductor devices, including basic environmental tests to determine resistance to deleterious effects of natural elements and...
November 12, 2002
TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES
Purpose. This standard establishes uniform methods for testing semiconductor devices, including basic environmental tests to determine resistance to deleterious effects of natural elements and...
April 30, 2001
TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES
This standard establishes uniform methods for testing semiconductor devices, including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions...
February 29, 2000
TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES
This standard establishes uniform methods for testing semiconductor devices, including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions...
February 23, 1996
TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES
This standard establishes uniform methods for testing semiconductor devices, including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions...
May 18, 1995
TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES
A description is not available for this item.
February 28, 1995
TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES
This standard establishes uniform methods for testing semiconductor devices, including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions...
August 15, 1994
TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES
A description is not available for this item.
May 31, 1994
TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES
A description is not available for this item.
November 19, 1993
TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES
This standard establishes uniform methods for testing semiconductor devices, including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions...
June 30, 1993
TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES
A description is not available for this item.
January 30, 1993
TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES
A description is not available for this item.
August 30, 1992
TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES
A description is not available for this item.
April 30, 1992
TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES
A description is not available for this item.
April 30, 1991
TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES
A description is not available for this item.
September 17, 1987
TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES
A description is not available for this item.
September 2, 1986
TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES
A description is not available for this item.
February 23, 1983
TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES
Purpose. This standard establishment uniform methods for testing semiconductors devices, including basic environmental tests to determine resistance to deleterious effects of natural elements and...
April 20, 1981
TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES
A description is not available for this item.
July 8, 1980
TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES
A description is not available for this item.
July 12, 1979
TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES
A description is not available for this item.
March 9, 1979
TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES
A description is not available for this item.

References

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