scope:

This part of ISO/IEC 10373 defines test methods for characteristics of integrated circuit(s) cards with contacts and related interface devices according to the definition given in ISO/IEC 7816. Each test method is cross-referenced to one or more base standards, which may be ISO/IEC 7810 or one or more of the supplementary standards that define the information storage technologies employed in identification card applications.

NOTE 1 Criteria for acceptability do not form part of this International Standard but will be found in the International Standards mentioned above.

This part of ISO/IEC 10373 deals with test methods, which are specific to integrated circuit technology with contacts. ISO/IEC 10373-1 deals with test methods which are common to one or more card technologies and other parts deal with other technology-specific tests.

Test methods described in this part of ISO/IEC 10373 are intended to be performed separately and independently. A given card is not required to pass through all the tests sequentially. The test methods described in this part of ISO/IEC 10373 are based on specifications defined or to be defined in ISO/IEC 7816.

Conformance of ICCs and IFDs determined using the test methods defined in this part of ISO/IEC 10373 do not preclude failures in the field. Reliability testing is outside the scope of this part of ISO/IEC 10373.