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NPFC - MIL-M-38510/340

MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, AND GATES, MONOLITHIC SILICON

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Organization: NPFC
Publication Date: 22 September 2003
Status: active
Page Count: 14
scope:

This specification covers the detail requirements for monolithic silicon, Advanced Schottky TTL, positive AND logic gate microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, (see 6.3).

intended Use:

Microcircuits conforming to this specification are intended for original equipment design applications and logistic support of existing equipment.

Document History

MIL-M-38510/340D VALID NOTICE 4
August 29, 2023
Microcircuits, Digital, Bipolar Advanced Schottky TTL, and Gates, Monolithic Silicon
A description is not available for this item.
MIL-M-38510/340
October 29, 2018
Microcircuits, Digital, Bipolar Advanced Schottky TTL, and Gates, Monolithic Silicon
A description is not available for this item.
MIL-M-38510/340
January 17, 2014
Microcircuits, Digital, Bipolar Advanced Schottky TTL, and Gates, Monolithic Silicon
A description is not available for this item.
MIL-M-38510/340
April 2, 2009
Microcircuits, Digital, Bipolar Advanced Schottky TTL, and Gates, Monolithic Silicon
This specification covers the detail requirements for monolithic silicon, Advanced Schottky TTL, positive AND logic gate microcircuits. Two product assurance classes and a choice of case outlines and...
MIL-M-38510/340
September 22, 2003
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, AND GATES, MONOLITHIC SILICON
This specification covers the detail requirements for monolithic silicon, Advanced Schottky TTL, positive AND logic gate microcircuits. Two product assurance classes and a choice of case outlines and...
MIL-M-38510/340
July 9, 2002
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, AND GATES, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/340
April 18, 1997
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, AND GATES, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/340
October 16, 1992
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, AND GATES, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/340C
January 11, 1988
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, AND GATES, MONOLITHIC SILICON
This specification covers the detail requirements for monolithic silicon, Advanced Schottky TTL, positive AND logic gate microcircuits. Two product assurance classes and a choice of case outlines and...
MIL-M-38510/340
January 27, 1986
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, AND GATES, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/340
June 24, 1985
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, AND GATES, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/340
August 9, 1983
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, AND GATES, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/340
December 10, 1982
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, AND GATES, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/340
May 19, 1981
MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, AND GATES, MONOLITHIC SILICON
A description is not available for this item.
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References

This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
This document references:
MIL-PRF-38535M - INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR
Published by DLA on November 1, 2022
Scope. This specification establishes the general performance requirements for integrated circuits or microcircuits and the quality and reliability assurance requirements, which are to be met for...
This document references:
MIL-STD-1835 - Electronic Component Case Outlines
Published by NPFC on September 21, 2009
This standard establishes and maintains a compilation of electronic component case outlines and should be useful to all levels of manufacturing that culminate in the production of reliable and...
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