CENELEC - EN 60749-4
Semiconductor Devices Mechanical and Climatic Test Methods Part 4: Damp Heat, Steady State, Highly Accelerated Stress Test (HAST)
inactive
| Organization: | CENELEC |
| Publication Date: | 1 August 2002 |
| Status: | inactive |
| Page Count: | 12 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
June 1, 2017
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
This part of IEC 60749 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid...
EN 60749-4
August 1, 2002
Semiconductor Devices Mechanical and Climatic Test Methods Part 4: Damp Heat, Steady State, Highly Accelerated Stress Test (HAST)
A description is not available for this item.