NPFC - MIL-S-19500/435
SEMICONDUCTOR DEVICE, DIODE, SILICON, LOW-NOISE VOLTAGE REGULATOR TYPES 1N4099-1, 1N4099C-1, 1N4099D-1 THROUGH 1N4135-1, 1N4135C-1, 1N4135D-1, 1N4614-1, 1N4614C-1, 1N4614D-1 THROUGH 1N4627-1, 1N4627C-1, 1N4627D-1, 1N4099UR-1, 1N4099CUR-1, 1N4099DUR-1 THROUGH 1N4135UR-1, 1N4135CUR-1, 1N4135DUR-1, 1N4614UR-1, 1N4614CUR-1, 1N4614DUR-1 THROUGH 1N462UR-1, 1N4627CUR-1, 1N4627DUR-1, JAN, JANTX, JANTXV, JANS, JANHC, AND JANKC
| Organization: | NPFC |
| Publication Date: | 21 October 1994 |
| Status: | inactive |
| Page Count: | 16 |
scope:
This specification covers the detail requirements for 500 milliwatt, silicon, low-noise, voltage regulator diodes with voltage tolerances of 5 percent, 2 percent, and 1 percent. Four levels of product assurance are provided for each encapsulated device type as specified in MIL-S-19500, and two levels of product assurance for each unencapsulated device type (die). For JANHC and JANKC quality levels see 6.4.
See figure 1 (DO-7 and DO-35), figure 2 (DO-213AA), and figure 3 (JANHC and JANKC).
Maximum ratings are as shown in 5 and 10 of table III herein and as follows:
PT = 500 mW (DO-7, DO-35) at TL = 50°C, L = .375 (9.53 mm); both ends of case or diode body to heat sink at L = .375 (9.53 mm). (Derate Iz to 0.0 mA dc at +175°C).
PT = 500 mW (D0-213AA) at TEC = 125°C. (Derate to 0 at 175°C).
−65°C ≤ Top ≤ + 175°C; −65°C ≤ TSTG ≤ + 175°C.
Primary electrical characteristic columns 2, 7, 8, and 9 of table III herein and as follows:
1.8 V dc ≤ Vz ≤ 100 V dc.
RΘJL = 250°C/W (maximum) at L = .375 inch (9.53 m) (DO-7 and DO-35).
RΘJEC = 100°C/W (maximum) junction to endcaps (DO-213AA). Beneficial comments (recommendations, additions, deletions) and any pertinent data which may be of use in improving this document should be addressed to: Commander, Defense Electronics Supply Center, ATTN: DESC-ELDT, 1507 Wilmington Pike, Dayton, OH 45444-5765, by using the Standardization Document Improvement Proposal (DD Form 1426) appearing at the end of this document or by letter.
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