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CENELEC - EN 60749-39

Semiconductor devices - Mechanical and climatic test methods Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components

inactive
Organization: CENELEC
Publication Date: 1 August 2006
Status: inactive
Page Count: 12
ICS Code (Semiconductor devices in general): 31.080.01

Document History

January 1, 2022
Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
This part of IEC 60749 details the procedures for the measurement of the characteristic properties of moisture diffusivity and water solubility in organic materials used in the packaging of...
EN 60749-39
August 1, 2006
Semiconductor devices - Mechanical and climatic test methods Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
A description is not available for this item.
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