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NPFC - MIL-M-38510/23

MICROCIRCUITS, DIGITAL, TTL, HIGH-SPEED, NAND GATES MONOLITHIC SILICON

inactive
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Organization: NPFC
Publication Date: 1 June 1977
Status: inactive
Page Count: 4

Document History

MIL-M-38510/23D VALID NOTICE 3
February 2, 2023
Microcircuits, Digital, TTL, High Speed, Nand Gates Monolithic Silicon
A description is not available for this item.
MIL-M-38510/23
April 3, 2013
Microcircuits, Digital, TTL, High Speed, Nand Gates Monolithic Silicon
A description is not available for this item.
MIL-M-38510/23
July 1, 2008
Microcircuits, Digital, TTL, High Speed, Nand Gates Monolithic Silicon
This specification covers the detail requirements for monolithic silicon, TTL, high speed, positive NAND logic gating microcircuits. Two product assurance classes and a choice of case outlines and...
MIL-M-38510/23
July 11, 2003
MICROCIRCUITS, DIGITAL, TTL, HIGH-SPEED, NAND GATES MONOLITHIC SILICON
This specification covers the detail requirements for monolithic silicon, TTL, high speed, positive NAND logic gating microcircuits. Two product assurance classes and a choice of case outlines and...
MIL-M-38510/23
June 25, 2002
MICROCIRCUITS, DIGITAL, TTL, HIGH-SPEED, NAND GATES MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/23A NOTICE 1
September 6, 1996
MICROCIRCUITS, DIGITAL, TTL, HIGH-SPEED, NAND GATES MONOLITHIC SILICON
A description is not available for this item.
MIL-M-0038510/23C CANC NOTICE 2
December 28, 1984
MICROCIRCUITS, DIGITAL, TTL, HIGH-SPEED, NAND GATES MONOLITHIC SILICON
A description is not available for this item.
MIL-M-0038510/23C NOTICE 1
July 10, 1981
MICROCIRCUITS, DIGITAL, TTL, HIGH-SPEED, NAND GATES MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/23
June 1, 1977
MICROCIRCUITS, DIGITAL, TTL, HIGH-SPEED, NAND GATES MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/23A (3)
June 17, 1976
MICROCIRCUITS, DIGITAL, TTL, HIGH-SPEED, NAND GATES MONOLITHIC SILICON
A description is not available for this item.
MIL-M-0038510/23C
December 1, 1975
MICROCIRCUITS, DIGITAL, TTL, HIGH-SPEED, NAND GATES MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/23
September 5, 1975
MICROCIRCUITS, DIGITAL, TTL, HIGH-SPEED, NAND GATES MONOLITHIC SILICON
A description is not available for this item.
MIL-M-0038510/23B (2)
January 6, 1975
MICROCIRCUITS, DIGITAL, TTL, HIGH-SPEED, NAND GATES MONOLITHIC SILICON
A description is not available for this item.
MIL-M-0038510/23B
October 15, 1973
MICROCIRCUITS, DIGITAL, TTL, HIGH-SPEED, NAND GATES MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/23
December 1, 1972
MICROCIRCUITS, DIGITAL, TTL, HIGH-SPEED, NAND GATES MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/23
July 14, 1972
MICROCIRCUITS, DIGITAL, TTL, HIGH-SPEED, NAND GATES MONOLITHIC SILICON
This specification covers the detail requirements for monolithic silicon, TTL, high speed, positive NAND logic gating microcircuits. Three product assurance classes and a choice of case outline/lead...
MIL-M-38510/23
September 30, 1971
MICROCIRCUITS, DIGITAL, TTL, HIGH-SPEED, NAND GATES MONOLITHIC SILICON
A description is not available for this item.
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References

This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
This document references:
MIL-PRF-38535M - INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR
Published by DLA on November 1, 2022
Scope. This specification establishes the general performance requirements for integrated circuits or microcircuits and the quality and reliability assurance requirements, which are to be met for...
This document references:
MIL-STD-1835 - Electronic Component Case Outlines
Published by NPFC on September 21, 2009
This standard establishes and maintains a compilation of electronic component case outlines and should be useful to all levels of manufacturing that culminate in the production of reliable and...
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