IPC-9261
In-Process DPMO and Estimated Yield for PCAs
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| Organization: | IPC |
| Publication Date: | 1 October 2006 |
| Status: | active |
| Page Count: | 24 |
scope:
This document defines standard methodologies for calculating defects per million opportunities (DPMO) metrics related to electronic printed board assembly processes. It is intended for use in measuring in-process assembly steps rather than end product determination. Calculation of completed item DPMO is addressed in IPC-7912.
Additionally, a guide to defect categorization is provided that when used with J-STD-001 and IPC-A-610 can serve as a base for summarizing and reporting in-process defects.
Note: This document does not dictate the number of assemblies or data points needed to calculate DPMO metrics.
Document History
IPC-9261
October 1, 2006
In-Process DPMO and Estimated Yield for PCAs
This document defines standard methodologies for calculating defects per million opportunities (DPMO) metrics related to electronic printed board assembly processes. It is intended for use in...
March 1, 2002
In-Process DPMO and Estimated Yield for PWAs
This document defines standard methodologies for calculating defects per million opportunities (DPMO) metrics related to electronic printed board assembly processes. It is intended for use in...