DLA - SMD-5962-91723
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, 4-BIT PRESETTABLE BINARY COUNTER, SYNCHRONOUS RESET, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
| Organization: | DLA |
| Publication Date: | 23 December 1992 |
| Status: | inactive |
| Page Count: | 26 |
scope:
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and space application (device classes S and V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available, a choice of radiation hardness assurance (RHA) levels are reflected in the PIN.
The PIN shall be as shown in the following example:
Device classes M, B, and S RHA marked devices shall meet the MIL-M-38510 specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-I-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
The device type(s) shall identify the circuit function as follows:
Device type Generic number Circuit function 01 1/ 54ACT163 4-bit, presettable binary counter, synchronous reset, TTL compatible inputs
The device class designator shall be a single letter identifying the product assurance level as follows:
Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 B or S Certification and qualification to MIL-M-38510 Q or V Certification and qualification to MIL-I-38535
The case outline(s) shall be as designated in MIL-STD-1835, and as follows:
Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line F GDFP2-F16 or CDFP3-F16 16 Flat 2 CQCC1-N20 or CQCC2-N20 20 Leadless chip carrier
The lead finish shall be as specified in MIL-M-38510 for classes M, B, and S or MIL-I-38535 for classes Q and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.
Supply voltage range (VCC) - - - - - - - - - - - - - - - - - −0.5 V dc to + 7.0 V dc Input voltage range - - - - - - - - - - - - - - - - - - - - −0.5 dc VCC +0.5 V dc 3/ Output voltage range - - - - - - - - - - - - - - - - - - - - −0.5 V dc to VCC + 0.5 V dc 3/ DC input diode current (IIK) ( −0.5 V ≤ VIN ≤ VCC + 0.5 V) - ±20 mA DC output diode current (IOK) (−0.5 V ≤ VOUT ≤ VCC + 0.5 V)- ±20 mA DC output current (IOUT) (per output pin) - - - - - - - - - ±50 mA DC VCC or GND current (ICC, IGND) (per pin) - - - - - - - - ±250 mA 4/ Power dissipation (PD) - - - - - - - - - - - - - - - - - - - 500 mW Thermal resistance (θJC) - - - - - - - - - - - - - - - - - - See MIL-STD-1835 Storage temperature range - - - - - - - - - - - - - - - - - −65°C to +150°C Junction temperature (TJ) - - - - - - - - - - - - - - - - - +175°C Lead temperature (soldering, 10 seconds) - - - - - - - - - +300°C
Supply voltage range (VCC) - - - - - - - - - - - - - - - - - - - +4.5 V dc to +5.5 V dc Input voltage range (VIN) - - - - - - - - - - - - - - - - - - - +0.0 V dc to VCC Output voltage range (VOUT) - - - - - - - - - - - - - - - - - - +0.0 V dc to VCC Maximum low level input voltage (VIL) - - - - - - - - - - - - - - 0.8 V dc Minimum high level input voltage (VIH) 6/ - - - - - - - - - - - - 3.0 V dc Case operating temperature range (TC) - - - - - - - - - - - - - - −55°C to +125°C Input edge rate (ΔV/Δt) maximum: (from VIN = 0.8 V to 2.0 V, 2.0 V to 0.8 V) - - - - - - - - - - 125 mV/ns Maximum high level output current (IOH) - - - - - - - - - - - - - −24 mA Maximum low level output current (IOL) - - - - - - - - - - - - - 24 mA
Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) - - - - - - - XX percent 7/
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Microcircuits... View More
Document History