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JEDEC - JESD91A

Method for Developing Acceleration Models for Electronic Component Failure Mechanisms

inactive
Organization: JEDEC
Publication Date: 1 August 2003
Status: inactive
Page Count: 20
scope:

The method described in this document applies to all reliability mechanisms associated with electronic components.The purpose of this standard is to provide a reference for developing acceleration models for defect-related and wear-out mechanisms in electronic components.

Document History

March 1, 2022
Method for Developing Acceleration Models for Electronic Device Failure Mechanisms
The method described in this document applies to all reliability mechanisms associated with electronic devices. The purpose of this standard is to provide a reference for developing acceleration...
August 1, 2003
Method for Developing Acceleration Models for Electronic Component Failure Mechanisms
The method described in this document applies to all reliability mechanisms associated with electronic components. The purpose of this standard is to provide a reference for developing acceleration...
JESD91A
August 1, 2003
Method for Developing Acceleration Models for Electronic Component Failure Mechanisms
The method described in this document applies to all reliability mechanisms associated with electronic components.The purpose of this standard is to provide a reference for developing acceleration...
December 1, 2001
Method for Developing Acceleration Models for Electronic Component Failure Mechanisms
A description is not available for this item.
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