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DLA - SMD-5962-89830

MICROCIRCUIT, LINEAR, DATA ACQUISITION SYSTEM, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 8 March 1990
Status: inactive
Page Count: 13

Document History

SMD 5962-89830
April 25, 2007
MICROCIRCUIT, LINEAR, DATA ACQUISITION SYSTEM, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
SMD-5962-89830 REV C
October 15, 1993
MICROCIRCUIT, LINEAR, DATA ACQUISITION SYSTEM, MONOLITHIC SILICON
This drawing describes device requirements for class 8 microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with .compliant non-JAN devices"....
SMD-5962-89830 REV B
May 26, 1993
MICROCIRCUIT, LINEAR, DATA ACQUISITION SYSTEM, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-89830 REV A
February 12, 1992
MICROCIRCUIT, LINEAR, DATA ACQUISITION SYSTEM, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-89830
March 8, 1990
MICROCIRCUIT, LINEAR, DATA ACQUISITION SYSTEM, MONOLITHIC SILICON
A description is not available for this item.

References

This document references:
MIL-STD-1835 - Electronic Component Case Outlines
Published by NPFC on September 21, 2009
This standard establishes and maintains a compilation of electronic component case outlines and should be useful to all levels of manufacturing that culminate in the production of reliable and...
This document references:
MIL-BUL-103AC CANC NOTICE 1 - LIST OF STANDARD MICROCIRCUIT DRAWINGS
Published by DLA on December 22, 1995
A description is not available for this item.
This document references:
MIL-M-38510 - MICROCIRCUITS, GENERAL SPECIFICATION FOR
Published by NPFC on August 27, 1993
A description is not available for this item.
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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