scope:

This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device classes M and Q), and nontraditional performance environment (device class N). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. For device class N, the user is cautioned to assure that the device is appropriate for the application environment.

The PIN is as shown in the following example:

Device classes N, Q, and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows:

Device type Generic number Circuit function 01 80C31BH 8-bit microcontroller (3.5 to 12 MHz) 02 80C51BH 8-bit microcontroller with a mask programmable ROM (3.5 to 12 MHz) 03 80C31BH-16 8-bit microcontroller (3.5 to 16 MHz) 04 80C51BH-16 8-bit microcontroller with a mask programmable ROM (3.5 to 16 MHz) 05 80C31BH 8-bit microcontroller (3.5 to 12 MHz) 06 80C51BH 8-bit microcontroller with a mask programmable ROM (3.5 to 12 MHz) 07 80C31BH-16 8-bit microcontroller (3.5 to 16 MHz) 08 80C51BH-16 8-bit microcontroller with a mask programmable ROM (3.5 to 16 MHz)

The device class designator is a single letter identifying the product assurance level as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A N Certification and qualification to MIL-PRF-38535 with a nontraditional performance environment 1/ Q or V Certification and qualification to MIL-PRF-38535

The case outline(s) are as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style M GQCC1-J44 44 "J" leaded chip carrier Q GDIP1-T40 or CDIP2-T40 40 Dual-in-line package U MS-011-AC 2/ 40 Plastic dual-in-line package V MS-018-AC 2/ 44 Plastic "J" leaded chip carrier X CQCC1-N44 44 Square chip carrier package Y (See figure 1) 52 Flat package

The lead finish is as specified in MIL-PRF-38535 for device classes N, Q, and V or MIL-PRF-38535, appendix A for device class M.

Supply voltage range (referenced to ground) ---------- +6.5 V dc maximum Maximum power dissipation (P_D) ----------------------- 200 mW Voltage (any pin) to V_SS ----------------------------- −0.5 V dc to V_CC +0.5 V dc Storage temperature range (T_STG)---------------------- −65°C to +150°C Maximum junction temperature (T_J) -------------------- +200°C Lead temperature (soldering 5 seconds)(T_S) ----------- +300°C Thermal resistance junction-to-case (θ_JC): Case M, Q, and X ----------------------------------- See MIL-STD-1835 Case Y --------------------------------------------- 20°C/W Case U --------------------------------------------- 15°C/W Case V --------------------------------------------- 14°C/W

Operating supply voltage range (V_CC)------------------ 4 V dc to +6 V dc Maximum low level input voltage (except EA)----------- 0.2 V_CC −0.25 V dc (EA) ----------------------------------------------- 0.2 V_CC −0.45 V dc Maximum high level input voltage (except XTAL1, RST)-- 0.2 V_CC + 1.1 V dc (XTA1, RST) ---------------------------------------- 0.7 V_CC + 0.2 V dc Case operating temperature range (T_C) Device types 01, 02, 03, and 04 -------------------- −55°C to +125°C Device types 05, 06, 07, and 08 -------------------- −40°C to +85°C Oscillator frequency Device types 01, 02, 05, and 06 -------------------- 3.5 MHz to 12 MHz Device types 03, 04, 07, and 08 -------------------- 3.5 MHz to 16 MHz

Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) -------- XX percent 4/

intended Use: