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NPFC - MIL-M-38510/122

MICROCIRCUITS, LINEAR, HIGH SLEW RATE OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON

inactive
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Organization: NPFC
Publication Date: 16 November 1994
Status: inactive
Page Count: 9

Document History

MIL-M-38510/122C VALID NOTICE 4
August 29, 2023
Microcircuits, Linear, High Slew Rate Operational Amplifiers, Monolithic Silicon
A description is not available for this item.
MIL-M-38510/122
October 29, 2018
Microcircuits, Linear, High Slew Rate Operational Amplifiers, Monolithic Silicon
A description is not available for this item.
MIL-M-38510/122
April 2, 2009
Microcircuits, Linear, High Slew Rate Operational Amplifiers, Monolithic Silicon
This specification covers the detail requirements for monolithic silicon, operational amplifier microcircuit. Two product assurance classes and a choice of case outlines and lead finishes are...
MIL-M-38510/122
May 26, 2004
MICROCIRCUITS, LINEAR, HIGH SLEW RATE OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON
This specification covers the detail requirements for monolithic silicon, operational amplifier microcircuit. Two product assurance classes and a choice of case outlines and lead finishes are...
MIL-M-38510/122
May 26, 2004
MICROCIRCUITS, LINEAR, HIGH SLEW RATE OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/122
September 17, 2003
MICROCIRCUITS, LINEAR, HIGH SLEW RATE OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON
This specification covers the detail requirements for monolithic silicon, operational amplifier microcircuit. Two product assurance classes and a choice of case outlines and lead finishes are...
MIL-M-38510/122
February 12, 1997
MICROCIRCUITS, LINEAR, HIGH SLEW RATE OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/122
July 13, 1995
MICROCIRCUITS, LINEAR, HIGH SLEW RATE OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/122
November 16, 1994
MICROCIRCUITS, LINEAR, HIGH SLEW RATE OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/122
September 15, 1989
MICROCIRCUITS, LINEAR, HIGH SLEW RATE OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON
This specification covers the detail requirements for monolithic silicon, operational amplifiers. Two product assurance classes and a choice of case outline and lead finish are provided for each type...
MIL-M-38510/122
May 26, 1982
MICROCIRCUITS, LINEAR, HIGH SLEW RATE OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/122
August 10, 1981
MICROCIRCUITS, LINEAR, HIGH SLEW RATE OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/122
April 7, 1981
MICROCIRCUITS, LINEAR, HIGH SLEW RATE OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/122 (1)
July 24, 1980
MICROCIRCUITS, LINEAR, HIGH SLEW RATE OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/122
April 9, 1980
MICROCIRCUITS, LINEAR, HIGH SLEW RATE OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON
A description is not available for this item.
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References

This document references:
MIL-STD-1835 - Electronic Component Case Outlines
Published by NPFC on September 21, 2009
This standard establishes and maintains a compilation of electronic component case outlines and should be useful to all levels of manufacturing that culminate in the production of reliable and...
This document references:
MIL-PRF-38535M - INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR
Published by DLA on November 1, 2022
Scope. This specification establishes the general performance requirements for integrated circuits or microcircuits and the quality and reliability assurance requirements, which are to be met for...
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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