DLA - SMD-5962-04229 REV A
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY (FPGA) 320K GATES WITH 24 DUAL-PORT SRAM MODULES, RADIATION HARDENED, MONOLITHIC SILICON
inactive
| Organization: | DLA |
| Publication Date: | 25 August 2006 |
| Status: | inactive |
| Page Count: | 44 |
scope:
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Document History
November 10, 2016
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY (FPGA) 320K GATES w/24 DUAL-PORT SRAM MODULES, RADIATION HARDENED, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
February 8, 2008
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY (FPGA) 320K GATES with 24 dual-port SRAM modules, RADIATION HARDENED, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD-5962-04229 REV A
August 25, 2006
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY (FPGA) 320K GATES WITH 24 DUAL-PORT SRAM MODULES, RADIATION HARDENED, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
September 6, 2005
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY (FPGA) 320K GATES WITH 24 DUAL-PORT SRAM MODULES, RADIATION HARDENED, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...