DOD - SMD 5962-04229
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY (FPGA) 320K GATES w/24 DUAL-PORT SRAM MODULES, RADIATION HARDENED, MONOLITHIC SILICON
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| Organization: | DOD |
| Publication Date: | 10 November 2016 |
| Status: | active |
| Page Count: | 41 |
scope:
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Document History
SMD 5962-04229
November 10, 2016
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY (FPGA) 320K GATES w/24 DUAL-PORT SRAM MODULES, RADIATION HARDENED, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
February 8, 2008
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY (FPGA) 320K GATES with 24 dual-port SRAM modules, RADIATION HARDENED, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
August 25, 2006
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY (FPGA) 320K GATES WITH 24 DUAL-PORT SRAM MODULES, RADIATION HARDENED, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
September 6, 2005
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY (FPGA) 320K GATES WITH 24 DUAL-PORT SRAM MODULES, RADIATION HARDENED, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...