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NPFC - MIL-M-38510/22

MICROCIRCUITS, DIGITAL, BIPOLAR, HIGH-SPEED TTL, FLIP-FLOPS, MONOLITHIC SILICON

inactive
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Organization: NPFC
Publication Date: 18 September 1985
Status: inactive
Page Count: 9

Document History

MIL-M-38510/22
March 17, 2015
Microcircuits, Digital, Bipolar, High-Speed TTL, Flip-Flops, Monolithic Silicon
A description is not available for this item.
MIL-M-38510/22
May 26, 2010
Microcircuits, Digital, Bipolar, High-Speed TTL, Flip-Flops, Monolithic Silicon
This specification covers the detail requirements for monolithic silicon, high speed TTL, bistable logic microcircuits. Two product assurance classes and a choice of case outlines and lead finishes...
MIL-M-38510/22D
August 12, 2005
MICROCIRCUITS, DIGITAL, BIPOLAR, HIGH-SPEED TTL, FLIP-FLOPS, MONOLITHIC SILICON
This specification covers the detail requirements for monolithic silicon, high speed TTL, bistable logic microcircuits. Two product assurance classes and a choice of case outlines and lead finishes...
MIL-M-38510/22
June 25, 2002
MICROCIRCUITS, DIGITAL, BIPOLAR, HIGH-SPEED TTL, FLIP-FLOPS, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/22
September 6, 1996
MICROCIRCUITS, DIGITAL, BIPOLAR, HIGH-SPEED TTL, FLIP-FLOPS, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/22
February 27, 1989
MICROCIRCUITS, DIGITAL, BIPOLAR, HIGH-SPEED TTL, FLIP-FLOPS, MONOLITHIC SILICON
This specification covers the detail requirements for monolithic silicon, high speed, TTL, bistable logic microcircuits. Qualification requirements are removed for device types 01, 02, 03, 05, and...
MIL-M-38510/22
September 18, 1985
MICROCIRCUITS, DIGITAL, BIPOLAR, HIGH-SPEED TTL, FLIP-FLOPS, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-0038510/22C CANC NOTICE 2
December 28, 1984
MICROCIRCUITS, DIGITAL, BIPOLAR, HIGH-SPEED TTL, FLIP-FLOPS, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-0038510/22C NOTICE 1
July 10, 1981
MICROCIRCUITS, DIGITAL, BIPOLAR, HIGH-SPEED TTL, FLIP-FLOPS, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/22
July 11, 1980
MICROCIRCUITS, DIGITAL, BIPOLAR, HIGH-SPEED TTL, FLIP-FLOPS, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/22
October 1, 1976
MICROCIRCUITS, DIGITAL, BIPOLAR, HIGH-SPEED TTL, FLIP-FLOPS, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-0038510/22C (1)
July 6, 1976
MICROCIRCUITS, DIGITAL, BIPOLAR, HIGH-SPEED TTL, FLIP-FLOPS, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-0038510/22C
December 1, 1975
MICROCIRCUITS, DIGITAL, BIPOLAR, HIGH-SPEED TTL, FLIP-FLOPS, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/22
October 31, 1975
MICROCIRCUITS, DIGITAL, BIPOLAR, HIGH-SPEED TTL, FLIP-FLOPS, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/22
June 21, 1973
MICROCIRCUITS, DIGITAL, BIPOLAR, HIGH-SPEED TTL, FLIP-FLOPS, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/22
September 30, 1971
MICROCIRCUITS, DIGITAL, BIPOLAR, HIGH-SPEED TTL, FLIP-FLOPS, MONOLITHIC SILICON
A description is not available for this item.
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References

This document references:
MIL-STD-1835 - Electronic Component Case Outlines
Published by NPFC on September 21, 2009
This standard establishes and maintains a compilation of electronic component case outlines and should be useful to all levels of manufacturing that culminate in the production of reliable and...
This document references:
MIL-PRF-38535M - INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR
Published by DLA on November 1, 2022
Scope. This specification establishes the general performance requirements for integrated circuits or microcircuits and the quality and reliability assurance requirements, which are to be met for...
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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