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DLA - SMD-5962-96621 REV A

MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, NAND GATES, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 24 February 1997
Status: inactive
Page Count: 30
scope:

This appendix establishes minimum requirements for microcircuit die to be supplied under the Qualified Manufacturers List (QML) Program. QML microcircuit die meeting the requirements of MIL-PRF-38535 and the manufacturers approved QM plan for use in monolithic microcircuits, multichip modules (MCMs), hybrids, electronic modules, or devices using chip and wire designs in accordance with MIL-PRF-38534 are specified herein. Two product assurance classes consisting of military high reliability (device class Q) and space application (device Class V) are reflected in the Part or Identification Number (PIN). When available a choice of Radiation Hardiness Assurance (RHA) levels are reflected in the PIN.

The PIN shall be as shown in the following example:

Device classes Q and V RHA identified die shall meet the MIL-PRF-38535 specified RHA levels. A dash (-) indicates a non-RHA die.

The device type(s) shall identify the circuit function as follows:

Device type Generic number Circuit function 01 4011B Radiation Hardened, CMOS, quad 2-input NAND gate 02 4012B Radiation Hardened CMOS, dual 4-input NAND gate 03 4023B Radiation Hardened CMOS, triple 3-input NAND gate 04 4011BN Radiation Hardened, CMOS, quad 2-input NAND gate, neutron irradiated die 05 4012BN Radiation Hardened CMOS, dual 4-input NAND gate, neutron irradiated die 06 4023BN Radiation Hardened CMOS, triple 3-input NAND gate, neutron irradiated die

Device class Device requirements documentation Q or V Certification and qualification to the die requirements of MIL-PRF-38535.

The die details designation shall be a unique letter which designates the die's physical dimensions, bonding pad location(s) and related electrical function(s), interface materials, and other assembly related information, for each product and variant supplied to this appendix.

Die Types Figure number 01, 04 A-1 02, 05 A-2 03, 06 A-3

Die Types Figure number 01, 04 A-1 02, 05 A-2 03, 06 A-3

Die Types Figure number 01, 04 A-1 02, 05 A-2 03, 06 A-3

01, 04 A-1 02, 05 A-2 03, 06 A-3

See paragraph 1.3 within the body of this drawing for details.

See paragraph 1.4 within the body of this drawing for details.

intended Use:

Microcircuit die conforming to this drawing are intended for use in microcircuits built in accordance with MIL-PRF-38535 or MIL-PRF-38534 for government microcircuit applications (original... View More

Document History

March 24, 2022
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, NAND GATES, MONOLITHIC SILICON
Scope. This drawing documents three product assurance class levels consisting of high reliability (device classes Q), space application (device class V) and for appropriate satellite and similar...
July 16, 2015
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, NAND GATES, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
September 7, 2005
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, NAND GATES, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
April 28, 1999
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, NAND GATES, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
December 7, 1998
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, NAND GATES, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
July 29, 1997
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, NAND GATES, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-96621 REV A
February 24, 1997
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, NAND GATES, MONOLITHIC SILICON
This appendix establishes minimum requirements for microcircuit die to be supplied under the Qualified Manufacturers List (QML) Program. QML microcircuit die meeting the requirements of MIL-PRF-38535...
November 27, 1995
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, NAND GATES, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliabitity (device classes Q and M) and...

References

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