DLA - MIL-S-19500/159H
SEMICONDUCTOR DEVICE, DIODE, SILICON, VOLTAGE-REFERENCE, TYPES 1N821, 11823, 11825, 1N827, 11829, AND 1N821-1, 111823-1, 11825-1, 1N827-1, AND 1N829-1, 1N821UR-1, lN823UR-1, 1N825UR-1, 1N82NR-1, AND 1N82WR-1, JAN, JANTX, JANTXV, JANS, JANHC AND JANKC; RADIATION HARDENED (TOTAL DOSE ONLY) TYPES JANTXVM, Dl LI RI FI GI H; JANSM, Dl LI RI F I GI H; JANHCII, Dl LI RI FI GI H; AND JANKCM, Dl LI RI F I GI H
| Organization: | DLA |
| Publication Date: | 16 May 1994 |
| Status: | inactive |
| Page Count: | 14 |
scope:
This specification covers the detail requirements for 6.2 volts ±5 percent, silicon, voltage-reference diodes. Four levels of product assurance are provided for each encapsulated device type as specified in MIL-S-19500, and two levels of product assurance for each unencapsulated device type die. Seven levels of radiation hardened (total dose only) product assurance are provided for each encapsulated device type as specified in MIL-S-19500, and two levels of product assurance for each unencapsulated device type die.
See figure 1 (D0-7 and D0-35), figure 2 (D0-213AA), figure 3 (JANHCA and JANKCA), and figure 4 (JANHCB and JANKCB).
Primary electrical characteristics at TA = +25°C unless otherwise specified. Beneficial comments (recommendations, additions, deletions) and any pertinent data which may be of use in improving this document should be addressed to: Commander, Defense Electronics Supply Center, ATTN: DESC-ELDT, 1507 Wilmington Pike, Dayton, OH 45444-5765 by using the Standardization Document Improvement Proposal (DD Form 1426) appearing at the end of this document or by letter.
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