DLA - SMD-5962-87684 REV E
MICROCIRCUIT, DIGITAL, 8-BIT, CHMOS MICROCONTROLLER WITH 4K BYTES EPROM MEMORY, MONOLITHIC SILICON
| Organization: | DLA |
| Publication Date: | 2 January 1996 |
| Status: | inactive |
| Page Count: | 33 |
scope:
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Three product assurance classes consisting of space application (device class V), military high reliability (device classes M and Q), and non-traditional military (device class N) with a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M, microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883,"Provisi
The PIN shall be as shown in the following example:
Device class M RHA marked devices shall meet the MIL-I-38535 appendix A specified RHA levels and shall be marked with the appropriate RHA designator. Device classes N, Q, and V RHA marked devices shall meet the MIL-I-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
The device type(s) shall identify the circuit function as follows:
Device type Generic number Circuit function Temperature range 01 87C51 8-bit microcontroller with 4k-bytes −55°C to 125°C EPROM memory. (3.5 to 12MHz) 02 87C51-16 8-bit microcontroller with 4k-bytes −55°C to 125°C EPROM memory. (3.5 to 16MHz) 03 87C51 8-bit microcontroller with one time −40°C to 85°C programmable memory. (3.5 to 12MHz) 04 87C51-16 8-bit microcontroller with one time −40°C to 85°C programmable memory. (3.5 to 16MHz) 05 87C51 8-bit microcontroller with one time −55°C to 125°C programmable memory. (3.5 to 12MHz) 06 87C51-16 8-bit microcontroller with one time −55°C to 125°C programmable memory. (3.5 to 16MHz)
The device class designator shall be a single letter identifying the product assurance level as follows:
Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 N Certification and qualification to MIL-I-38535 with a non-traditional performance environment 1/ Q or V Certification and qualification to MIL-I-38535
The case outline(s) shall be as designated in MIL-STD-1835 and as follows:
Outline letter Descriptive designator Terminals Package style U CQCC1-N44 44 leadless chip carrier 2/ Q CDIP2-T40 or GDIP1-T40 40 dual-in-line package 2/ M GQCC1-J44 44 J-leaded chip carrier 2/ X See figure 1 40 plastic dip package Y See figure 1 44 plastic J-leaded chip carrier
The lead finish shall be as specified in MIL-STD-883 (see 3.1 herein) for class M or MIL-I-38535 for classes N, Q, and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.
Storage temperature range - - - - - - - - - - - - - −65°C to +150°C Voltage on EA/VPP pin to VSS - - - - - - - - - - - 0 V dc to +13.0 V dc Voltage on any pin to VSS - - - - - - - - - - - - - −0.5 V dc to +6.5 V dc Power dissipation (PD) - - - - - - - - - - - - - - 1.5 W Maximum junction temperature (TJ) - - - - - - - - - +200°C Lead temperature (soldering, 10 seconds)- - - - - - +300°C Thermal resistance, junction-to-case (θJC) Cases U, Q, and M - - - - - - - - - - - - - - - - See MIL-STD-1835 Case X - - - - - - - - - - - - - - - - - - - - 15°C/W Case Y - - - - - - - - - - - - - - - - - - - - 14°C/W
Supply voltage (VCC) - - - - - - - - - - - - - - - - 5.0 V dc ±10% Case operating temperature range (TC) Devices 01, 02, 05, 06 - - - - - - - - - - - - - - −55°C to +125°C Devices 03, 04 - - - - - - - - - - - - - - - - - −40°C to +85°C Maximum input low voltage(except [E bar][A bar]) - - - - - - - - 0.2VCC − 0.25 V Maximum input low voltage ([E bar][A bar]) - - - - - - - - - - - 0.2VCC − 0.45 V Minimum input high voltage (except XTAL1, RESET) - - 0.2VCC + 1.1 V Minimum input high voltage (XTAL1 & RESET) - - - - - 0.7VCC + 0.2 V
Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) . . . . . . XX percent 4/
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
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