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BSI - BS EN 60749-34

Semiconductor devices Mechanical and climatic test methods Part 34: Power Cycling

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Organization: BSI
Publication Date: 22 June 2004
Status: inactive
Page Count: 12
ICS Code (Semiconductor devices in general): 31.080.01

Document History

BS EN 60749-34
February 28, 2011
Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
A description is not available for this item.
BS EN 60749-34
June 22, 2004
Semiconductor devices Mechanical and climatic test methods Part 34: Power Cycling
A description is not available for this item.

References

This document references:
IEC 60747-2 - Semiconductor devices - Part 2: Discrete devices - Rectifier diodes
Published by IEC on April 1, 2016
This part of IEC 60747 provides standards for the following categories or sub-categories of rectifier diodes, including: • line rectifier diodes; • avalanche rectifier diodes; • fast-switching...
This document references:
IEC 60749-3 - Semiconductor devices – Mechanical and climatic test methods – Part 3: External visual examination
Published by IEC on March 1, 2017
The purpose of this part of IEC 60749 is to verify that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement...
This document references:
IEC 60747-1 - Semiconductor devices – Part 1: General
Published by IEC on August 1, 2010
This part of IEC 60747 gives the general requirements applicable to the discrete semiconductor devices and integrated circuits covered by the other parts of IEC 60747 and IEC 60748 (see Annex A).
This document references:
IEC 60749-23 - Semiconductor devices – Mechanical and climatic test methods – Part 23: High temperature operating life
Published by IEC on March 1, 2011
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily...
This document references:
IEC 60747-6 - Semiconductor devices - Part 6: Discrete devices - Thyristors
Published by IEC on April 1, 2016
This part of IEC 60747 provides standards for the following types of discrete semiconductor devices: – reverse-blocking triode thyristors; – reverse-conducting (triode) thyristors; – bidirectional...
This document is referenced by:
BS EN 60749-23 - Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Published by BSI on June 24, 2004
A description is not available for this item.
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