DLA - SMD-5962-87554 REV C
MICROCIRCUIT, DIGITAL, CMOS, 1-OF-8 DECODER/DEMULTIPLEXER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
| Organization: | DLA |
| Publication Date: | 5 November 1997 |
| Status: | inactive |
| Page Count: | 24 |
scope:
This drawing documents two product assurance class levels consisting of high reliability (device classes B, Q and M),and space application (device classes S and V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN
The PIN is as shown in the following example:
Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device classes M, B, and S RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
The device type(s) identity the circuit function as follows:
Device type Generic number Circuit function
01 54ACT138 1-of-8 decoder/demultiplexe
The device class designator is a single letter identifying the product assurance level as follows:
Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A B or S Certification and qualification to MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535
The case outline(s) are as designated in MIL-STD-1835 and as follows:
Outline letter Descriptive designator Terminals Package style
E GDIP1-T16 or CDIP2-T16 16 Dual-in-line
F GDFP2-F16 or CDFP3-F16 16 Flat
2 CQCC1-N20 or CQCC2-N20 20 Leadless-chip-carrie
The lead finish is as specified in MIL-PRF-38535 for device classes Q, and V or MIL-PRF-38535, appendix A for device classes M, B, and S.
Supply voltage range (VCC)...................
Supply voltage range (VCC)...................
Fault coverage measurement of manufacturing
logic tests (MIL-STD-883, test method 5012)...............
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Microcircuits... View More
Document History