IEC 60749-20
Semiconductor devices – Mechanical and climatic test methods – Part 20: Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat
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Organization: | IEC |
Publication Date: | 1 September 2002 |
Status: | inactive |
Page Count: | 58 |
ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History

August 1, 2020
Semiconductor devices – Mechanical and climatic test methods – Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
This part of IEC 60749 provides a means of assessing the resistance to soldering heat of semiconductors packaged as plastic encapsulated surface mount devices (SMDs). This test is destructive.

December 1, 2008
Semiconductor devices – Mechanical and climatic test methods – Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
A description is not available for this item.

August 1, 2003
SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 20: Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat CORRIGENDUM 1
A description is not available for this item.

IEC 60749-20
September 1, 2002
Semiconductor devices – Mechanical and climatic test methods – Part 20: Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat
A description is not available for this item.