DLA - SMD-5962-96867 REV A
MICROCIRCUIT, DIGITAL, ADVANCED HIGH SPEED CMOS OCTAL TRANSPARENT D-TYPE LATCH WITH 3-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
inactive
| Organization: | DLA |
| Publication Date: | 27 June 1997 |
| Status: | inactive |
| Page Count: | 22 |
Document History
December 17, 2021
MICROCIRCUIT, DIGITAL, ADVANCED HIGH-SPEED CMOS, OCTAL TRANSPARENT D-TYPE LATCH WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
Scope.
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes...
March 25, 2015
MICROCIRCUIT, DIGITAL, ADVANCED HIGHSPEED CMOS, OCTAL TRANSPARENT D-TYPE LATCH WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
January 21, 2009
MICROCIRCUIT, DIGITAL, ADVANCED HIGH-SPEED CMOS, OCTAL TRANSPARENT D-TYPE LATCH WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
September 3, 1997
MICROCIRCUIT, DIGITAL, ADVANCED HIGH SPEED CMOS OCTAL TRANSPARENT D-TYPE LATCH WITH 3-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-96867 REV A
June 27, 1997
MICROCIRCUIT, DIGITAL, ADVANCED HIGH SPEED CMOS OCTAL TRANSPARENT D-TYPE LATCH WITH 3-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
A description is not available for this item.
September 6, 1996
MICROCIRCUIT, DIGITAL, ADVANCED HIGH SPEED CMOS OCTAL TRANSPARENT D-TYPE LATCH WITH 3-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...