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BSI - BS PD IEC/TS 62132-9

Integrated circuits — Measurement of electromagnetic immunity Part 9: Measurement of radiated immunity — Surface scan method

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Organization: BSI
Publication Date: 30 September 2014
Status: active
Page Count: 32
ICS Code (Integrated circuits. Microelectronics): 31.200

Document History

BS PD IEC/TS 62132-9
September 30, 2014
Integrated circuits — Measurement of electromagnetic immunity Part 9: Measurement of radiated immunity — Surface scan method
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References

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