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DOD - SMD 5962-86063

MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 262, 144-BIT (32K x 8) UV ERASABLE PROM, MONOLITHIC SILICON

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Organization: DOD
Publication Date: 12 February 2015
Status: inactive
Page Count: 23
scope:

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Document History

March 22, 2022
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 262,144-BIT (32K x 8) UV ERASABLE PROM, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. Replaceability....
June 5, 2015
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 262,144-BIT (32K x 8) UV ERASABLE PROM, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD 5962-86063
February 12, 2015
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 262, 144-BIT (32K x 8) UV ERASABLE PROM, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
July 17, 2006
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 262, 144-BIT (32K X 8) UV ERASABLE PROM, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
June 11, 1997
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 262, 144-BIT (32K X 8) UV ERASABLE PROM, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
February 16, 1994
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 262, 144-BIT (32K X 8) UV ERASABLE PROM, MONOLITHIC SILICON
This drawing describes device requirements for class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices"....
October 15, 1993
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 262, 144-BIT (32K X 8) UV ERASABLE PROM, MONOLITHIC SILICON
A description is not available for this item.
January 30, 1992
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 262, 144-BIT (32K X 8) UV ERASABLE PROM, MONOLITHIC SILICON
A description is not available for this item.
December 5, 1990
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 262, 144-BIT (32K X 8) UV ERASABLE PROM, MONOLITHIC SILICON
A description is not available for this item.
February 1, 1989
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 262, 144-BIT (32K X 8) UV ERASABLE PROM, MONOLITHIC SILICON
A description is not available for this item.
December 17, 1987
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 262, 144-BIT (32K X 8) UV ERASABLE PROM, MONOLITHIC SILICON
A description is not available for this item.
February 12, 1987
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 262, 144-BIT (32K X 8) UV ERASABLE PROM, MONOLITHIC SILICON
A description is not available for this item.

References

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