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NPFC - MIL-PRF-32516

ELECTRONIC TEST EQUIPMENT, INTERMITTENT FAULT DETECTION AND ISOLATION FOR CHASSIS AND BACKPLANE CONDUCTIVE PATHS

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Organization: NPFC
Publication Date: 23 March 2015
Status: active
Page Count: 26
scope:

This specification covers the minimum performance requirements for equipment to detect and isolate nanosecond, microsecond and millisecond conductive paths (see 6.4.4) and intermittent faults (see 6.4.2), which can occur in any and all of the hundreds to thousands of Line Replaceable Unit (LRU)/Weapon Replaceable Assembly (WRA) chassis and backplane circuits and their wire harnesses. This specification is not intended to address hard opens (see 6.4.11), shorts (see 6.4.12), nor constant function failures found in routine electronics repair.

Classification. Diagnostic equipment is classified by its intermittent fault duration detection capability, as follows:

Category 1. Short duration intermittent faults (see 6.4.5) that are under 100 nanoseconds across all LRU/WRA backplane circuits and associated wire harnesses.

Category 2. Intermediate duration intermittent faults (see 6.4.6) that are 101 nanoseconds to 500 microseconds across all LRU/WRA backplane circuits and associated wire harnesses.

Category 3. Long duration intermittent faults (see 6.4.7) that are 501 microseconds to 5 milliseconds across all LRU/WRA backplane circuits and associated wire harnesses.

DISTRIBUTION STATEMENT A. Approved for public release; distribution unlimited.

intended Use:

The diagnostic equipment covered by this specification is intended for use in detecting and isolating intermittent faults in LRU/WRA, chassis and backplanes and their wire harnesses.... View More

Document History

August 4, 2022
ELECTRONIC TEST EQUIPMENT, INTERMITTENT FAULT DIAGNOSTIC (ELECTRICAL)
The diagnostic equipment defined in this specification is intended for use in detecting and isolating intermittent faults in LRUs/WRAs (see 6.5.12 and 6.5.19) chassis and backplane circuits and their...
MIL-PRF-32516
March 23, 2015
ELECTRONIC TEST EQUIPMENT, INTERMITTENT FAULT DETECTION AND ISOLATION FOR CHASSIS AND BACKPLANE CONDUCTIVE PATHS
This specification covers the minimum performance requirements for equipment to detect and isolate nanosecond, microsecond and millisecond conductive paths (see 6.4.4) and intermittent faults (see...

References

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