IEC TS 62878-2-4
Device embedded substrate – Part 2-4: Guidelines – Test element groups (TEG)
|Publication Date:||1 March 2015|
|ICS Code (Electronic component assemblies):||31.190|
|ICS Code (Printed circuits and boards):||31.180|
This part of IEC 62878 describes the test element group devices useful when measuring basic properties of device embedded substrates.
This part of IEC 62878 is applicable to device embedded substrates fabricated by use of organic base material, which include for example active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components.
The IEC 62878 series neither applies to the re-distribution layer (RDL) nor to the electronic modules defined as an M-type business model in IEC 62421.