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DLA - SMD-5962-88721

MICROCIRCUIT, LINEAR, DUAL, LOW NOISE, OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 17 October 1988
Status: inactive
Page Count: 8
scope:

This drawing describes device requirements for class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices".

The complete part number shall be as shown in the following example:

The device types shall identify the circuit function as follows:

Device type Generic number Circuit function 01 OP-270A Dual, low-noise, precision, operational amplifier 02 OP-271A Dual, low-noise, high-speed, operational amplifier

The case outlines shall be as designated in appendix C of MIL-M-38510, and as follows:

Outline letter Case outline P D-4 (8-lead, .405" × .310" × .200"), dual-in-line package 2 C-2 (20 terminal, .358" × .358" × .100"), square chip carrier package

Supply voltage (VS)- - - - - - - - - - - - - - - - - ±18 V Differential input voltage 1/- - - - - - - - - - - - ±1 V Differential input current 1/- - - - - - - - - - - - ±25 mA Input voltage- - - - - - - - - - - - - - - - - - - - Supply voltage Output short-circuit - - - - - - - - - - - - - - - - Continuous Storage temperature range- - - - - - - - - - - - - - −65°C to +150°C Lead temperature (soldering, 60 seconds) - - - - - - +300°C Junction temperature (TJ)- - - - - - - - - - - - - - +150°C Thermal resistance (θJC) - - - - - - - - - - - - - - See MIL-M-38510, appendix C Thermal resistance (θJA): Case P - - - - - - - - - - - - - - - - - - - - - - 45°C/W Case 2 - - - - - - - - - - - - - - - - - - - - - - 35°C/W

Supply voltage (VS)- - - - - - - - - - - - - - - - - ±15 V Source resistance (RS) - - - - - - - - - - - - - - - 50Ω Ambient operating temperature range (TA) - - - - - - −55°C to +125°C

intended Use:

Microcircuits conforming to this drawing are intended for use when military specifications do not exist and qualified military devices that will perform the required function are not available for... View More

Document History

SMD 5962-88721
February 22, 2021
MICROCIRCUIT, LINEAR, DUAL, LOW NOISE, OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON
Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead...
SMD 5962-88721
December 16, 2015
MICROCIRCUIT, LINEAR, DUAL, LOW NOISE, OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are...
SMD 5962-88721
January 9, 2013
MICROCIRCUIT, LINEAR, DUAL, LOW NOISE, OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD-5962-88721 REV E
December 21, 2006
MICROCIRCUIT, LINEAR, DUAL, LOW NOISE, OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD-5962-88721 REV D
November 9, 2005
MICROCIRCUIT, LINEAR, DUAL, LOW NOISE, OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD-5962-88721 REV C
March 21, 2003
MICROCIRCUIT, LINEAR, DUAL, LOW NOISE, OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-88721 REV B
October 5, 2000
MICROCIRCUIT, LINEAR, DUAL, LOW NOISE, OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD-5962-88721 REV A
April 13, 2000
MICROCIRCUIT, LINEAR, DUAL, LOW NOISE, OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD-5962-88721
October 17, 1988
MICROCIRCUIT, LINEAR, DUAL, LOW NOISE, OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON
This drawing describes device requirements for class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices"....
View Less
View All

References

This document references:
MIL-STD-1835 - Electronic Component Case Outlines
Published by NPFC on September 21, 2009
This standard establishes and maintains a compilation of electronic component case outlines and should be useful to all levels of manufacturing that culminate in the production of reliable and...
This document references:
MIL-HDBK-103 - LIST OF STANDARD MICROCIRCUIT DRAWINGS
Published by NPFC on March 8, 2021
Purpose. The Standard Microcircuit Drawing Program (SMDP) is directly under the auspices of the DoD Parts Management Program (PMP). The PMP is implemented by MIL-HDBK-512, "Parts Management." The PMP...
This document references:
MIL-HDBK-780D VALID NOTICE 1 - Standard Microcircuit Drawings
Published by DLA on December 28, 2021
A description is not available for this item.
This document references:
MIL-PRF-38535M - INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR
Published by DLA on November 1, 2022
Scope. This specification establishes the general performance requirements for integrated circuits or microcircuits and the quality and reliability assurance requirements, which are to be met for...
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
View Less
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